Presentation 2002/5/24
A Discussion on Reliability of Optical Cross-Connect Switches Applied to Photonic Networks
Kazuhiro NOGUCHI, Masafumi KOGA, Ken-ichi SATO,
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Abstract(in English) Three-dimensional MEMS optical switches (3D-MEMS), planar lightwave circuit thermo-optical switches (PLC-TOSW) are attractive because these switches are suitable for large-scale optical cross-connect switches (OXCs). In usual, such large-scale optical switches are composed of a lot of small switch units. Therefore, the reliability of the individual switch element much affects on the OXCs. We estimate the affection of the number or failure probability of the switch elements on the OXC reliability by statistical calculations. We also estimate and discuss on the reliability improvement due to the switch duplication (preparing spare switches).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optical Switch / Optical Cross-Connect / Photonic Network
Paper # OCS2002-23
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Committee OCS
Conference Date 2002/5/24(1days)
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Registration To Optical Communication Systems (OCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Discussion on Reliability of Optical Cross-Connect Switches Applied to Photonic Networks
Sub Title (in English)
Keyword(1) Optical Switch
Keyword(2) Optical Cross-Connect
Keyword(3) Photonic Network
1st Author's Name Kazuhiro NOGUCHI
1st Author's Affiliation NTT Network Innovation Laboratories()
2nd Author's Name Masafumi KOGA
2nd Author's Affiliation NTT Network Innovation Laboratories
3rd Author's Name Ken-ichi SATO
3rd Author's Affiliation NTT Network Innovation Laboratories
Date 2002/5/24
Paper # OCS2002-23
Volume (vol) vol.102
Number (no) 104
Page pp.pp.-
#Pages 6
Date of Issue