Presentation | 1995/9/29 Improvement of DC-Drift Characteristics in Ti : LiNbO_3 Modulator M. Seino, T. Nakazawa, S. Taniguchi, M. Doi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | DC-drift phenomena are the serious problem for LiNbO_3-waveguide devices. The quantity of DC-drift phenomena were defined and the general properties were described. We found that the LN-waveguide devices with minus-quantity DC-drift phenomena are favorable to compensate the DC-drift. The conditions to make minus-quantity DC-drift were introduced and the minus-quantity DC-drift modulators were made and evaluated the DC-drift properties and obtained activation energies. That results improved substantially the DC-drift. We simulated the DC-drift compensation circuit and obtained that this device has the failure rate of less than 1 fit after 20 years at 65℃. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | LiNbO_3 / DC-drift / minus-quantity DC-drift / LN-modulator / failure rate |
Paper # | OCS95-66,OPE95-82,LQE95-76 |
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Conference Information | |
Committee | OCS |
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Conference Date | 1995/9/29(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Optical Communication Systems (OCS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Improvement of DC-Drift Characteristics in Ti : LiNbO_3 Modulator |
Sub Title (in English) | |
Keyword(1) | LiNbO_3 |
Keyword(2) | DC-drift |
Keyword(3) | minus-quantity DC-drift |
Keyword(4) | LN-modulator |
Keyword(5) | failure rate |
1st Author's Name | M. Seino |
1st Author's Affiliation | FUJITSU LABORATORIES LTD., Personal Systems Laboratories() |
2nd Author's Name | T. Nakazawa |
2nd Author's Affiliation | FUJITSU LABORATORIES LTD., Personal Systems Laboratories |
3rd Author's Name | S. Taniguchi |
3rd Author's Affiliation | FUJITSU LABORATORIES LTD., Personal Systems Laboratories |
4th Author's Name | M. Doi |
4th Author's Affiliation | FUJITSU LABORATORIES LTD., Personal Systems Laboratories |
Date | 1995/9/29 |
Paper # | OCS95-66,OPE95-82,LQE95-76 |
Volume (vol) | vol.95 |
Number (no) | 273 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |