Presentation 1995/9/29
Improvement of DC-Drift Characteristics in Ti : LiNbO_3 Modulator
M. Seino, T. Nakazawa, S. Taniguchi, M. Doi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) DC-drift phenomena are the serious problem for LiNbO_3-waveguide devices. The quantity of DC-drift phenomena were defined and the general properties were described. We found that the LN-waveguide devices with minus-quantity DC-drift phenomena are favorable to compensate the DC-drift. The conditions to make minus-quantity DC-drift were introduced and the minus-quantity DC-drift modulators were made and evaluated the DC-drift properties and obtained activation energies. That results improved substantially the DC-drift. We simulated the DC-drift compensation circuit and obtained that this device has the failure rate of less than 1 fit after 20 years at 65℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LiNbO_3 / DC-drift / minus-quantity DC-drift / LN-modulator / failure rate
Paper # OCS95-66,OPE95-82,LQE95-76
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Conference Information
Committee OCS
Conference Date 1995/9/29(1days)
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Paper Information
Registration To Optical Communication Systems (OCS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improvement of DC-Drift Characteristics in Ti : LiNbO_3 Modulator
Sub Title (in English)
Keyword(1) LiNbO_3
Keyword(2) DC-drift
Keyword(3) minus-quantity DC-drift
Keyword(4) LN-modulator
Keyword(5) failure rate
1st Author's Name M. Seino
1st Author's Affiliation FUJITSU LABORATORIES LTD., Personal Systems Laboratories()
2nd Author's Name T. Nakazawa
2nd Author's Affiliation FUJITSU LABORATORIES LTD., Personal Systems Laboratories
3rd Author's Name S. Taniguchi
3rd Author's Affiliation FUJITSU LABORATORIES LTD., Personal Systems Laboratories
4th Author's Name M. Doi
4th Author's Affiliation FUJITSU LABORATORIES LTD., Personal Systems Laboratories
Date 1995/9/29
Paper # OCS95-66,OPE95-82,LQE95-76
Volume (vol) vol.95
Number (no) 273
Page pp.pp.-
#Pages 6
Date of Issue