Presentation 2001/10/19
A Technique to Suppress Performance Degradation on VT-CMOS Data Cache using Address Prediction
Ryo FUJIOKA, Kiyokazu KATAYAMA, Ryotaro KOBAYASHI, Hideki ANDO, Toshio SHIMADA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) As the threshold voltage in CMOS circuits goes low, the leakage current, which is ignored so far, increases. This paper proposes a technique that suppresses processor performance degradation when a power-control scheme, called Dynamic Leakage Cut-off (DLC), is adopted to VT-CMOS cache. The DLC scheme causes a long delay to activate circuits in a selected line, leading Performance degradation. Our schemes predict a reference line with address prediction and changes the threshold voltage to the low level in advance. As a result, the delay of changing the threshold voltage is hidden and performance degradation is suppressed. Our results show that our mechanism can suppress performance loss to 17.2% and 3.1% on average for SPECint95 benchmark and SPECfp95 benchmark respectively, while the conventional DLC cache degrades performance by 23.2% and 9.7% respectively. The results also show that our mechanism slightly increases the leakage power over the DLC cache, but can still reduce the power to approximately 1% of that of the usual non-DLC cache.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) leakage current / L1 data cache / VT-CMOS / address prediction
Paper # DSP2001-120,ICD2001-125,IE2001-104
Date of Issue

Conference Information
Committee DSP
Conference Date 2001/10/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Digital Signal Processing (DSP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Technique to Suppress Performance Degradation on VT-CMOS Data Cache using Address Prediction
Sub Title (in English)
Keyword(1) leakage current
Keyword(2) L1 data cache
Keyword(3) VT-CMOS
Keyword(4) address prediction
1st Author's Name Ryo FUJIOKA
1st Author's Affiliation Department of Information Electronics, Graduate School of Engineering, Nagoya University()
2nd Author's Name Kiyokazu KATAYAMA
2nd Author's Affiliation Department of Information Electronics, Graduate School of Engineering, Nagoya University
3rd Author's Name Ryotaro KOBAYASHI
3rd Author's Affiliation Department of Information Electronics, Graduate School of Engineering, Nagoya University
4th Author's Name Hideki ANDO
4th Author's Affiliation Department of Information Electronics, Graduate School of Engineering, Nagoya University
5th Author's Name Toshio SHIMADA
5th Author's Affiliation Department of Information Electronics, Graduate School of Engineering, Nagoya University
Date 2001/10/19
Paper # DSP2001-120,ICD2001-125,IE2001-104
Volume (vol) vol.101
Number (no) 384
Page pp.pp.-
#Pages 8
Date of Issue