Presentation | 1997/3/7 A Method for Achieving a High-resolution APD Measuring Circuit Masaharu UCHINO, Yoshinobu HAYASHI, Takashi SHINOZUKA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A multiple M-sequence counting(MMC) method is presented that can measure an amplitude probability distribution at high speed by combining M-sequence counters having relatively prime cycles and by using residue number systems. This method call achieve counters with minimal delay time through the use of M-sequence counters, and through partitioned counting, can minimize number representation size required for restoration from the M-sequence pattern to counter values. Moreover, by arranging n MMC sections in parallel, processing speed can be easily increased by n times. When applied to the evaluation of the effects of electromagnetic disturbance on high-speed digital communications, this method can be used to estimate the degradation in communication quality based on measurement data for the amplitude probability distribution of the disturbance. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | amplitude probability distribution / digital signal processing / M-sequence / primitive trinomial / residue number system |
Paper # | CAS96-110,DSP96-161,CS96-166 |
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Conference Information | |
Committee | DSP |
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Conference Date | 1997/3/7(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Digital Signal Processing (DSP) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Method for Achieving a High-resolution APD Measuring Circuit |
Sub Title (in English) | |
Keyword(1) | amplitude probability distribution |
Keyword(2) | digital signal processing |
Keyword(3) | M-sequence |
Keyword(4) | primitive trinomial |
Keyword(5) | residue number system |
1st Author's Name | Masaharu UCHINO |
1st Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd.() |
2nd Author's Name | Yoshinobu HAYASHI |
2nd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
3rd Author's Name | Takashi SHINOZUKA |
3rd Author's Affiliation | Electromagnetic Compatibility Research Laboratories Co., Ltd. |
Date | 1997/3/7 |
Paper # | CAS96-110,DSP96-161,CS96-166 |
Volume (vol) | vol.96 |
Number (no) | 552 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |