Presentation 1997/3/7
A Method for Achieving a High-resolution APD Measuring Circuit
Masaharu UCHINO, Yoshinobu HAYASHI, Takashi SHINOZUKA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A multiple M-sequence counting(MMC) method is presented that can measure an amplitude probability distribution at high speed by combining M-sequence counters having relatively prime cycles and by using residue number systems. This method call achieve counters with minimal delay time through the use of M-sequence counters, and through partitioned counting, can minimize number representation size required for restoration from the M-sequence pattern to counter values. Moreover, by arranging n MMC sections in parallel, processing speed can be easily increased by n times. When applied to the evaluation of the effects of electromagnetic disturbance on high-speed digital communications, this method can be used to estimate the degradation in communication quality based on measurement data for the amplitude probability distribution of the disturbance.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) amplitude probability distribution / digital signal processing / M-sequence / primitive trinomial / residue number system
Paper # CAS96-110,DSP96-161,CS96-166
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Conference Information
Committee DSP
Conference Date 1997/3/7(1days)
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Registration To Digital Signal Processing (DSP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Method for Achieving a High-resolution APD Measuring Circuit
Sub Title (in English)
Keyword(1) amplitude probability distribution
Keyword(2) digital signal processing
Keyword(3) M-sequence
Keyword(4) primitive trinomial
Keyword(5) residue number system
1st Author's Name Masaharu UCHINO
1st Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.()
2nd Author's Name Yoshinobu HAYASHI
2nd Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
3rd Author's Name Takashi SHINOZUKA
3rd Author's Affiliation Electromagnetic Compatibility Research Laboratories Co., Ltd.
Date 1997/3/7
Paper # CAS96-110,DSP96-161,CS96-166
Volume (vol) vol.96
Number (no) 552
Page pp.pp.-
#Pages 8
Date of Issue