Presentation | 2001/6/29 Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method Chang Jung Kim, Insook Yi, Ilsub Chung, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Recently, the ferroelectrics bismuth lanthanum titanate (Bi_<3.25>La_<0.75>Ti_3O_<12>) thin film has been expected as a novel material for FRAM device since it has a large polarization, fatigue free, and crystallized at low temperature compared to SrBi_2Ta_2O_9 material. The BLT thin film was fabricated successfully on Pt/Ti/SiO_2/Si substrate by chemical solution deposition method. The films were crystallized at the temperature range of 600~700℃ using rapid thermal process and quartz tube furnace. X-ray diffraction shows a ferroelectric single-phase film. The spontaneous polarization (Ps) and the switching polarization of BLT film annealed at 700℃ for 2 min are 16.75 and 13.14 uC/cm^2, respectively. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | BLT / ferroelectric thin film / rapid thermal annealing / furnace annealing / FeRAM |
Paper # | ED2001-85, SDM2001-92 |
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Conference Information | |
Committee | ED |
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Conference Date | 2001/6/29(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method |
Sub Title (in English) | |
Keyword(1) | BLT |
Keyword(2) | ferroelectric thin film |
Keyword(3) | rapid thermal annealing |
Keyword(4) | furnace annealing |
Keyword(5) | FeRAM |
1st Author's Name | Chang Jung Kim |
1st Author's Affiliation | Materials and Devices Lab, Samsung Advanced Institute of Technology() |
2nd Author's Name | Insook Yi |
2nd Author's Affiliation | Materials and Devices Lab, Samsung Advanced Institute of Technology |
3rd Author's Name | Ilsub Chung |
3rd Author's Affiliation | Materials and Devices Lab, Samsung Advanced Institute of Technology |
Date | 2001/6/29 |
Paper # | ED2001-85, SDM2001-92 |
Volume (vol) | vol.101 |
Number (no) | 161 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |