Presentation 2001/6/29
Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method
Chang Jung Kim, Insook Yi, Ilsub Chung,
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Abstract(in English) Recently, the ferroelectrics bismuth lanthanum titanate (Bi_<3.25>La_<0.75>Ti_3O_<12>) thin film has been expected as a novel material for FRAM device since it has a large polarization, fatigue free, and crystallized at low temperature compared to SrBi_2Ta_2O_9 material. The BLT thin film was fabricated successfully on Pt/Ti/SiO_2/Si substrate by chemical solution deposition method. The films were crystallized at the temperature range of 600~700℃ using rapid thermal process and quartz tube furnace. X-ray diffraction shows a ferroelectric single-phase film. The spontaneous polarization (Ps) and the switching polarization of BLT film annealed at 700℃ for 2 min are 16.75 and 13.14 uC/cm^2, respectively.
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Keyword(in English) BLT / ferroelectric thin film / rapid thermal annealing / furnace annealing / FeRAM
Paper # ED2001-85, SDM2001-92
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Committee ED
Conference Date 2001/6/29(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
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Title (in English) Electrical properties of BLT thin films prepared by CSD(chemical Solution Deposition)method
Sub Title (in English)
Keyword(1) BLT
Keyword(2) ferroelectric thin film
Keyword(3) rapid thermal annealing
Keyword(4) furnace annealing
Keyword(5) FeRAM
1st Author's Name Chang Jung Kim
1st Author's Affiliation Materials and Devices Lab, Samsung Advanced Institute of Technology()
2nd Author's Name Insook Yi
2nd Author's Affiliation Materials and Devices Lab, Samsung Advanced Institute of Technology
3rd Author's Name Ilsub Chung
3rd Author's Affiliation Materials and Devices Lab, Samsung Advanced Institute of Technology
Date 2001/6/29
Paper # ED2001-85, SDM2001-92
Volume (vol) vol.101
Number (no) 161
Page pp.pp.-
#Pages 6
Date of Issue