Presentation | 2001/5/30 Sb and Bi passivation effect on GaAs Nobuhiro Kuroda, Hideaki Ikoma, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Sb and Bi passivation effects on GaAs (100) surface were investigated. Good I-V characteristics with low reverse leakage current and high Schottky barrier height were obtained, when Sb-and Bi-layer thicknesses were adequate. From XPS and SIMS data, passivation effects are considered to stem from Sb-and Bi-terminations of GaAs surface, removal of native oxide on GaAs and suppressions of Au (electrode) diffusion into GaAs with Sb and Bi layers. Uniform GaN/GaAs structures were obtained by plasma nitridation of Sb/GaAs sample. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | GaAs / Sb / Bi / passivation / GaN/GaAs / J-V characteristics |
Paper # | ED2001-51 |
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Conference Information | |
Committee | ED |
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Conference Date | 2001/5/30(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Sb and Bi passivation effect on GaAs |
Sub Title (in English) | |
Keyword(1) | GaAs |
Keyword(2) | Sb |
Keyword(3) | Bi |
Keyword(4) | passivation |
Keyword(5) | GaN/GaAs |
Keyword(6) | J-V characteristics |
1st Author's Name | Nobuhiro Kuroda |
1st Author's Affiliation | Science University of Tokyo() |
2nd Author's Name | Hideaki Ikoma |
2nd Author's Affiliation | Science University of Tokyo |
Date | 2001/5/30 |
Paper # | ED2001-51 |
Volume (vol) | vol.101 |
Number (no) | 104 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |