Presentation 2001/5/30
Realization of thermally stable ohmic contact using Cu-Hf amorphous alloy film to n-type InP
Mayumi B. TAKEYAMA, Nobuhisa SAKAGUCHI, Atsushi NOYA, Tamotsu HASHIZUME, Hideki HASEGAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The electrical property as well as the interfacial reaction and/or diffusion have been investigated in the Cu-Hf/InP contact to realize the thermally stable ohmic contact to n-type InP. As compared with results of the previous Cu-Zr/InP contact, the application of the Cu-Hf amorphous alloy similarly brings about the good I-V characteristics, and the formation of the uniform interlayer at the Cu-Hf/InP interface suppressing the Cu diffusion into the InP substrate after rapid thermal annealing (RTA), although the formed interlayer is not Cu-P but Cu-In at the interface. It is revealed that Cu-based amorphous alloys are one of the excellent materials applicable as an ohmic contact to n-type InP.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InP / ohmic contact / interfacial reaction / electrical property / amorphous alloy
Paper # ED2001-44
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Committee ED
Conference Date 2001/5/30(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Realization of thermally stable ohmic contact using Cu-Hf amorphous alloy film to n-type InP
Sub Title (in English)
Keyword(1) InP
Keyword(2) ohmic contact
Keyword(3) interfacial reaction
Keyword(4) electrical property
Keyword(5) amorphous alloy
1st Author's Name Mayumi B. TAKEYAMA
1st Author's Affiliation Dept. of Electrical and Electronic Engineering, Kitami Institute of Technology()
2nd Author's Name Nobuhisa SAKAGUCHI
2nd Author's Affiliation Dept. of Electrical and Electronic Engineering, Kitami Institute of Technology
3rd Author's Name Atsushi NOYA
3rd Author's Affiliation Dept. of Electrical and Electronic Engineering, Kitami Institute of Technology
4th Author's Name Tamotsu HASHIZUME
4th Author's Affiliation Research Center for Interface Quantum Electronics, Hokkaido University
5th Author's Name Hideki HASEGAWA
5th Author's Affiliation Research Center for Interface Quantum Electronics, Hokkaido University
Date 2001/5/30
Paper # ED2001-44
Volume (vol) vol.101
Number (no) 104
Page pp.pp.-
#Pages 6
Date of Issue