Presentation | 2000/12/8 Emission stability of FEA observed by an emission microscope Hideaki Nakane, Kouichi Yamane, Yasufumi Mutoh, Hirosi Adachi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The stability of the emission current of FEA are important parameters on its display application. Electron emission from a FEA was magnified by making use of an emission microscope, and the stability of the individual microtip was examined. The number of observable microtips increased with the total emission current of the whole FEA, and approached to 60% of it. Some microtips showed unstable emission and the number of such unstable microtips increased with the total emission current. Gas molecules adsorbed locally on tip top moved by ion bombardment, the emission current should be varied. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Emission Microscope / Field Emitter Array / Emission stability |
Paper # | ED2000-205 |
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Committee | ED |
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Conference Date | 2000/12/8(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Emission stability of FEA observed by an emission microscope |
Sub Title (in English) | |
Keyword(1) | Emission Microscope |
Keyword(2) | Field Emitter Array |
Keyword(3) | Emission stability |
1st Author's Name | Hideaki Nakane |
1st Author's Affiliation | Muroran Institute of Technology Department of Electrical and Electronic Engineering() |
2nd Author's Name | Kouichi Yamane |
2nd Author's Affiliation | Muroran Institute of Technology Department of Electrical and Electronic Engineering |
3rd Author's Name | Yasufumi Mutoh |
3rd Author's Affiliation | Muroran Institute of Technology Department of Electrical and Electronic Engineering |
4th Author's Name | Hirosi Adachi |
4th Author's Affiliation | Muroran Institute of Technology Department of Electrical and Electronic Engineering |
Date | 2000/12/8 |
Paper # | ED2000-205 |
Volume (vol) | vol.100 |
Number (no) | 506 |
Page | pp.pp.- |
#Pages | 6 |
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