Presentation 2000/12/8
Emission stability of FEA observed by an emission microscope
Hideaki Nakane, Kouichi Yamane, Yasufumi Mutoh, Hirosi Adachi,
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Abstract(in English) The stability of the emission current of FEA are important parameters on its display application. Electron emission from a FEA was magnified by making use of an emission microscope, and the stability of the individual microtip was examined. The number of observable microtips increased with the total emission current of the whole FEA, and approached to 60% of it. Some microtips showed unstable emission and the number of such unstable microtips increased with the total emission current. Gas molecules adsorbed locally on tip top moved by ion bombardment, the emission current should be varied.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Emission Microscope / Field Emitter Array / Emission stability
Paper # ED2000-205
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Committee ED
Conference Date 2000/12/8(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Emission stability of FEA observed by an emission microscope
Sub Title (in English)
Keyword(1) Emission Microscope
Keyword(2) Field Emitter Array
Keyword(3) Emission stability
1st Author's Name Hideaki Nakane
1st Author's Affiliation Muroran Institute of Technology Department of Electrical and Electronic Engineering()
2nd Author's Name Kouichi Yamane
2nd Author's Affiliation Muroran Institute of Technology Department of Electrical and Electronic Engineering
3rd Author's Name Yasufumi Mutoh
3rd Author's Affiliation Muroran Institute of Technology Department of Electrical and Electronic Engineering
4th Author's Name Hirosi Adachi
4th Author's Affiliation Muroran Institute of Technology Department of Electrical and Electronic Engineering
Date 2000/12/8
Paper # ED2000-205
Volume (vol) vol.100
Number (no) 506
Page pp.pp.-
#Pages 6
Date of Issue