Presentation | 2000/7/21 Formation of ohmic contact in Cu-Zr/n-InP system by rapid thermal annealing Mayumi B. TAKEYAMA, Junichi ITAI, Atsushi NOYA, Tamotsu HASHIZUME, Hideki HASEGAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The electrical property as well as the interfacial reaction and/or diffusion have been investigated in the Cu-Zr/InP contact to realize the thermally-stable ohmic contact to n-type InP. The application of the Cu-Zr amorphous alloy brings about the formation of the uniform interlayer at the Cu-Zr/InP interface suppressing the Cu diffusion into the InP substrate after rapid thermal annealing(RTA), resulting in the realization of the low contact resistivity at this interface upon RTA at 500℃ for 20s. It is revealed that the Cu-Zr amorphous alloy is one of the excellent materials applicable as an ohmic contact to n-type InP. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | metal-semiconductor interface / InP / ohmic contact / interfacial reaction / amorphous alloy |
Paper # | ED2000-103 |
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Conference Information | |
Committee | ED |
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Conference Date | 2000/7/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Formation of ohmic contact in Cu-Zr/n-InP system by rapid thermal annealing |
Sub Title (in English) | |
Keyword(1) | metal-semiconductor interface |
Keyword(2) | InP |
Keyword(3) | ohmic contact |
Keyword(4) | interfacial reaction |
Keyword(5) | amorphous alloy |
1st Author's Name | Mayumi B. TAKEYAMA |
1st Author's Affiliation | Dept.of Electrical and Electronic Engineering, Kitami Institute of Technology() |
2nd Author's Name | Junichi ITAI |
2nd Author's Affiliation | Dept.of Electrical and Electronic Engineering, Kitami Institute of Technology |
3rd Author's Name | Atsushi NOYA |
3rd Author's Affiliation | Dept.of Electrical and Electronic Engineering, Kitami Institute of Technology |
4th Author's Name | Tamotsu HASHIZUME |
4th Author's Affiliation | Research Center for Interface Quantum Electronics, Hokkaido University |
5th Author's Name | Hideki HASEGAWA |
5th Author's Affiliation | Research Center for Interface Quantum Electronics, Hokkaido University |
Date | 2000/7/21 |
Paper # | ED2000-103 |
Volume (vol) | vol.100 |
Number (no) | 236 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |