Presentation 2000/6/23
ED2000-88 / SDM2000-88 The influence of parasitic bipolar transistor on high-frequency performance of thin-film SOI power MOSFETs
Yasushi Hiraoka, Satoshi Matsumoto, Tatsuo Sakai,
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Abstract(in English) We have studied the influence of a parasitic bipolar transistor on the high-frequency characteristics of an SOI power MOSFET. We carried out two types of numerical simulation based on experimentally obtained results : a transient simulation and a harmonic balance simulation. The results indicate that the parasitic bipolar effect degraded the high-frequency performance of the RF power MOSFET, for example, gain, power added efficiency, and intermodulation distortion. In particular, the third-order intermodulation distortion of the quasi-SOI device was about 23% better than that of the conventional SOI device under 2 GHz operation.
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Keyword(in English) SOI / RF / Power MOSFET / Power amplifier and parasitic bipolar effect
Paper # ED2000-88,SDM2000-88
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Committee ED
Conference Date 2000/6/23(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) ED2000-88 / SDM2000-88 The influence of parasitic bipolar transistor on high-frequency performance of thin-film SOI power MOSFETs
Sub Title (in English)
Keyword(1) SOI
Keyword(2) RF
Keyword(3) Power MOSFET
Keyword(4) Power amplifier and parasitic bipolar effect
1st Author's Name Yasushi Hiraoka
1st Author's Affiliation NTT Telecommunications Energy Laboratories()
2nd Author's Name Satoshi Matsumoto
2nd Author's Affiliation NTT Telecommunications Energy Laboratories
3rd Author's Name Tatsuo Sakai
3rd Author's Affiliation NTT Telecommunications Energy Laboratories
Date 2000/6/23
Paper # ED2000-88,SDM2000-88
Volume (vol) vol.100
Number (no) 149
Page pp.pp.-
#Pages 5
Date of Issue