| Presentation | 2000/6/23 ED2000-85 / SDM2000-85 Deep sub-μm Scale Photoluminescence Image of Wide Bandgap Materials by Cryogenic Scanning Microscope Masahiro Yoshimoto, Junji Saraie, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A novel photoluminescence (PL) microscope using a conventional optical system has been developed to obtain monochromated PL mapping at a low temperature down to 15 K with a spatial resolution in sub-μm range. The objective and the cooled sample were put in the identical vacuum chamber in order to take thermal insulation between them. The spatial resolution of the microscope at a low temperature was confirmed to be almost equal to the theoretical limit expected from numerical aperture, i. e., 0.3 μm at a wavelength of 488 nm. A monochromated PL image at a wavelength of 666 nm for GaAs_<0.67>P_<0.33> epilayer on GaP was demonstrated with a spatial resolution of 0.5 μm at 20 K. The influence of a surface defect on an excitonic PL emission of 4H-SiC was discussed based on a PL image. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | microscopic photoluminescence / cryogenic temperature / deep-submicron resolution / SiC / GaAsP |
| Paper # | ED2000-85,SDM2000-85 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2000/6/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | ED2000-85 / SDM2000-85 Deep sub-μm Scale Photoluminescence Image of Wide Bandgap Materials by Cryogenic Scanning Microscope |
| Sub Title (in English) | |
| Keyword(1) | microscopic photoluminescence |
| Keyword(2) | cryogenic temperature |
| Keyword(3) | deep-submicron resolution |
| Keyword(4) | SiC |
| Keyword(5) | GaAsP |
| 1st Author's Name | Masahiro Yoshimoto |
| 1st Author's Affiliation | Dept. Electronics and Information Science, Kyoto Institute of Technology() |
| 2nd Author's Name | Junji Saraie |
| 2nd Author's Affiliation | Dept. Electronics and Information Science, Kyoto Institute of Technology |
| Date | 2000/6/23 |
| Paper # | ED2000-85,SDM2000-85 |
| Volume (vol) | vol.100 |
| Number (no) | 149 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |