Presentation 2000/6/23
ED2000-83 / SDM2000-83 1/f noise in Schottky barrier structure
J. I. Lee, I. K. Han, H.J. Kim, D. M. Kim, J. Grini, A. Chovet, S. A. Dimitriadis,
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Abstract(in English) We critically review and compare all the possible mechanisms for generation of low frequency noise in Schottky barrier structure, including mobility and diffusivity fluctuation, thermal activation and tunneling involving bulk traps and a new random walk model involving interface traps, and show how the noise measurement can be utilized to obtain useful information on bulk and/or interface traps and further diagnose the materials and certain process conditions for the fabrication of Schottky barrier structure.
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Keyword(in English) low frequency noise / Schottky barrier / thermal activation / tunneling / random walk
Paper # ED2000-83,SDM2000-83
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Committee ED
Conference Date 2000/6/23(1days)
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Language KOR
Title (in Japanese) (See Japanese page)
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Title (in English) ED2000-83 / SDM2000-83 1/f noise in Schottky barrier structure
Sub Title (in English)
Keyword(1) low frequency noise
Keyword(2) Schottky barrier
Keyword(3) thermal activation
Keyword(4) tunneling
Keyword(5) random walk
1st Author's Name J. I. Lee
1st Author's Affiliation Photonics Research Center, KIST, Cheongryang : On leave at Basic S & T Program, KISTEP()
2nd Author's Name I. K. Han
2nd Author's Affiliation Photonics Research Center, KIST, Cheongryang
3rd Author's Name H.J. Kim
3rd Author's Affiliation Photonics Research Center, KIST, Cheongryang
4th Author's Name D. M. Kim
4th Author's Affiliation School of Electrical Engineering, Kookmin Univ.
5th Author's Name J. Grini
5th Author's Affiliation LPCS UMR CNRS
6th Author's Name A. Chovet
6th Author's Affiliation LPCS UMR CNRS
7th Author's Name S. A. Dimitriadis
7th Author's Affiliation Dept. Physics, Univ. of Thessaloniki
Date 2000/6/23
Paper # ED2000-83,SDM2000-83
Volume (vol) vol.100
Number (no) 149
Page pp.pp.-
#Pages 6
Date of Issue