| Presentation | 1999/8/26 Large Signal Analysis Using GaAs FET Monte Carlo Simulator Yasuko Hori, Waiter Contrata, Yuji Ando, Norihiko Samoto, Masaaki Kuzuhara, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Large signal characteristics of a Gaps FET were calculated by adding an external matching circuit to a Monte Cargo device simulator. The circuit (LCR configuration) allows the impedance to be designed flexibly. Breakdown was modeled by introducing a gate tunneling current, and the resulting change in load line was analyzed, Impact ionization under large signal amplification was alsoinvestigated. The results show that the Monte Carlo device model is not only useful for the design of power amplifiers, including matching circuits, but also for the analysis of device physics under RF amplification. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Monte Carlo simulation / GaAs FET / large signal analysis / matching circuit / impact ionization |
| Paper # | ED99-147 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1999/8/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Assistant | |
| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Large Signal Analysis Using GaAs FET Monte Carlo Simulator |
| Sub Title (in English) | |
| Keyword(1) | Monte Carlo simulation |
| Keyword(2) | GaAs FET |
| Keyword(3) | large signal analysis |
| Keyword(4) | matching circuit |
| Keyword(5) | impact ionization |
| 1st Author's Name | Yasuko Hori |
| 1st Author's Affiliation | Kansai Electronics Research Laboratories, NEC Corporatiorn() |
| 2nd Author's Name | Waiter Contrata |
| 2nd Author's Affiliation | Kansai Electronics Research Laboratories, NEC Corporatiorn |
| 3rd Author's Name | Yuji Ando |
| 3rd Author's Affiliation | Kansai Electronics Research Laboratories, NEC Corporatiorn |
| 4th Author's Name | Norihiko Samoto |
| 4th Author's Affiliation | Kansai Electronics Research Laboratories, NEC Corporatiorn |
| 5th Author's Name | Masaaki Kuzuhara |
| 5th Author's Affiliation | Kansai Electronics Research Laboratories, NEC Corporatiorn |
| Date | 1999/8/26 |
| Paper # | ED99-147 |
| Volume (vol) | vol.99 |
| Number (no) | 281 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |