Presentation | 1999/7/22 A 1.8GHz Driver Amp Design and Production DC Screening Techniques for RF Performances of Bipolar ICs Sang-Gug Lee, Sang-Oh Lee, Jin-Su Ko, YunSeok Cho, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A novel approach for DC screening of the monolithic silicon bipolar RFICs for noise figure (NF) and power gain (S_<21>) is presented. The proposed technique, which is applied to a 1.8 GHz driver amp, demonstrates excellent correlation between the resistance of a proposed r_b test structure and the NF and S_<21> of the RFIC. This study show that setting a limit on the base resistance of bipolar junction transistors (BJTs) is effective in screening the AC performances of any RFICs as well as transistors. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Driver Amp / RF IC / Bipolar Junction Transistor / Noise Figure / Power Gain |
Paper # | ED99-107 |
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Committee | ED |
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Conference Date | 1999/7/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A 1.8GHz Driver Amp Design and Production DC Screening Techniques for RF Performances of Bipolar ICs |
Sub Title (in English) | |
Keyword(1) | Driver Amp |
Keyword(2) | RF IC |
Keyword(3) | Bipolar Junction Transistor |
Keyword(4) | Noise Figure |
Keyword(5) | Power Gain |
1st Author's Name | Sang-Gug Lee |
1st Author's Affiliation | Information and Communications University() |
2nd Author's Name | Sang-Oh Lee |
2nd Author's Affiliation | Samsung Electronics |
3rd Author's Name | Jin-Su Ko |
3rd Author's Affiliation | Samsung Electronics |
4th Author's Name | YunSeok Cho |
4th Author's Affiliation | Handong University |
Date | 1999/7/22 |
Paper # | ED99-107 |
Volume (vol) | vol.99 |
Number (no) | 229 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |