| Presentation | 1999/7/22 Accurate Extraction of Bias-Dependent MOSFET Parameters for RF Model Applications Seonghearn Lee, Hyun Kyu Yu, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Gate voltage-dependence data of MOSFET model parameters obtained by the RF extraction method based on Z-parameters expressions has been presented. These extracted RF data are shown to be explainable from short-channel or nonquasi-static effects. The gate voltage-dependencies of intrinsic capacitances and conductances for different size of MOSFETs show the linear scaling behavior with a reasonable error in terms of total gate width. This information will be very useful to develop a scalable large-signal model of multi-finger MOSFETs for nonlinear RF IC design. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | MOSFETs / RF IC / MOSFET model / equivalent circuits / parameter extraction / modeling |
| Paper # | ED99-106 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1999/7/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Accurate Extraction of Bias-Dependent MOSFET Parameters for RF Model Applications |
| Sub Title (in English) | |
| Keyword(1) | MOSFETs |
| Keyword(2) | RF IC |
| Keyword(3) | MOSFET model |
| Keyword(4) | equivalent circuits |
| Keyword(5) | parameter extraction |
| Keyword(6) | modeling |
| 1st Author's Name | Seonghearn Lee |
| 1st Author's Affiliation | Department of Electronic Engineering, Hankuk University of Foreign Studies() |
| 2nd Author's Name | Hyun Kyu Yu |
| 2nd Author's Affiliation | Micro-Electronics Technology Laboratory, Electronics and Telecommunications Research Institute |
| Date | 1999/7/22 |
| Paper # | ED99-106 |
| Volume (vol) | vol.99 |
| Number (no) | 229 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |