Presentation 1999/7/22
Control of Boron Lateral Diffusion by Nitrogen Implantation in Sub-0.15mm CMOS Devices
S.-K. Hong, J.-H. Choi, S.-G. Lee, C.-Y. Kang, J.-H. Son, J.-G. Ahn, J.-M. Hwang,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Although LDD nitrogen implantation on NMOSFET can peculiarly improve hot carrier lifetime, it also develops short channel effects and I_/I_ characteristic's degradation. On the contrary, nitrogen in PMOSFET results in the improvement of V_ roll-off and thus channel length margin. These can be explained by the retardation of boron by nitrogen. Nitrogen directly affects the effective channel length by controlling the boron diffusion in channel direction. We can conclude that the nitrogen implantation technique has some trade-off between the device characteristics and the lifetime reliabilities in NMOSFET, but can provide more channel length margin in PMOSFET.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Nitrogen implantation / CMOS / DAHC / channel length margin / effective channel length
Paper # ED99-96
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Committee ED
Conference Date 1999/7/22(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Control of Boron Lateral Diffusion by Nitrogen Implantation in Sub-0.15mm CMOS Devices
Sub Title (in English)
Keyword(1) Nitrogen implantation
Keyword(2) CMOS
Keyword(3) DAHC
Keyword(4) channel length margin
Keyword(5) effective channel length
1st Author's Name S.-K. Hong
1st Author's Affiliation LG Semicon Co., Ltd, R&D Division()
2nd Author's Name J.-H. Choi
2nd Author's Affiliation LG Semicon Co., Ltd., R&D Division
3rd Author's Name S.-G. Lee
3rd Author's Affiliation LG Semicon Co., Ltd., R&D Division
4th Author's Name C.-Y. Kang
4th Author's Affiliation LG Semicon Co., Ltd., R&D Division
5th Author's Name J.-H. Son
5th Author's Affiliation LG Semicon Co., Ltd., R&D Division
6th Author's Name J.-G. Ahn
6th Author's Affiliation LG Semicon Co., Ltd., R&D Division
7th Author's Name J.-M. Hwang
7th Author's Affiliation LG Semicon Co., Ltd., R&D Division
Date 1999/7/22
Paper # ED99-96
Volume (vol) vol.99
Number (no) 229
Page pp.pp.-
#Pages 5
Date of Issue