Presentation 1999/7/22
Low temperature epitaxy of Si by remote plasma process
A. Yoshida, A. Wakahara, K. Utsumi, In-Ho Bae,
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Abstract(in English) We have been successful in growing Si epitaxial films below 473K and even at room temperature, using remote plasma-enhanced process. In this report, we review our experimental results on the Si low temperature epitaxy. A plasma tube in concentric arrangement was used: argon and/or hydrogen plasma excited with rf power was supplied through the outer glass tube, and disilane source gas was introduced through the inner stainless tube. In-situ surface cleaning with hydrogen plasma was essential. The dependence on the substrate temperature, rf power and gas flow rate has been investigated. The deposited films were characterized by RHEED, TEM and RBS measurements.
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Keyword(in English) plasma-excited process / low temperature epitaxy / Si epitaxial growth / RBS
Paper # ED99-85
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Committee ED
Conference Date 1999/7/22(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Low temperature epitaxy of Si by remote plasma process
Sub Title (in English)
Keyword(1) plasma-excited process
Keyword(2) low temperature epitaxy
Keyword(3) Si epitaxial growth
Keyword(4) RBS
1st Author's Name A. Yoshida
1st Author's Affiliation Toyohashi University of Technology()
2nd Author's Name A. Wakahara
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name K. Utsumi
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name In-Ho Bae
4th Author's Affiliation Department of Physics, Yeungnam University
Date 1999/7/22
Paper # ED99-85
Volume (vol) vol.99
Number (no) 229
Page pp.pp.-
#Pages 6
Date of Issue