Presentation | 1994/11/18 Interference of carrier transport in semiconductor superlattices due to space charge field screening Makoto Hosoda, Kouji Tominaga, Hajime Ohnishi, Toshihide Watanabe, Kenzou Fujiwara, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Carrier transport in short-period superlattices is experimentally studied using time-resolved photoluminescence,time- resolved photocurrent and photocurrent spectra under high optical input intensities.Observed rapid collapse of Wannier-Stark localization indicates electric field screening by photo-generated space charges with a positive feedback process near blue-shifted absorption band-edge.Pile-up of carriers beside clad layers of superlattice is clearly explained with the Fowler-Nordheim tunneling scheme.In addition,a temporally delayed photoluminescence from the end of superlattice region indicates the carrier transit time in superlattice and a reverse injection of electron due to an inverse screening field mainly created by holes through effective-mass filtering. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | space charge screening / short-period superlattice / Wannier- Stark localization |
Paper # | ED94-91,CPM94-87 |
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Conference Information | |
Committee | ED |
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Conference Date | 1994/11/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Interference of carrier transport in semiconductor superlattices due to space charge field screening |
Sub Title (in English) | |
Keyword(1) | space charge screening |
Keyword(2) | short-period superlattice |
Keyword(3) | Wannier- Stark localization |
1st Author's Name | Makoto Hosoda |
1st Author's Affiliation | ATR Optical and Radio Communications Research Laboratories() |
2nd Author's Name | Kouji Tominaga |
2nd Author's Affiliation | ATR Optical and Radio Communications Research Laboratories |
3rd Author's Name | Hajime Ohnishi |
3rd Author's Affiliation | ATR Optical and Radio Communications Research Laboratories |
4th Author's Name | Toshihide Watanabe |
4th Author's Affiliation | ATR Optical and Radio Communications Research Laboratories |
5th Author's Name | Kenzou Fujiwara |
5th Author's Affiliation | Department of Electrical Engineering,Kyushu Institute of Technology |
Date | 1994/11/18 |
Paper # | ED94-91,CPM94-87 |
Volume (vol) | vol.94 |
Number (no) | 346 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |