| Presentation | 1994/5/20 Electrical effects of growth interruption in Liquid-Phase Epitaxial Al_xGa_1-x>Sb Hiroyasu Ogino, Masaya Ichimura, Akira Usami, Takao Wada, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | When a pn junction is grown by liquid-phase epitaxy(LPE),the growth is inevitably interrupted at the junction.In this study, electrical properties of LPE grown n-type Al_xGa_1-x>Sb with a growth-interruption interface were investigated by current- voltage(I-V)and deep level transient spectroscopy(DLTS)techniques. We found that when the growth was interrupted,reverse current of AI Schottky diodes had only weak tendency of saturation.After an annealing,reverse I-V characteristics exhibited much clearer saturation.In the case of sgmples with an interruption interface, deep electron traps reland to the interface were detected by DLTS but not detected after the annealing. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Al_xGa_1-x>Sb / Liquid Phase Epitaxy / growth-interruption interface / current-voltage characteristic / deep level transient spectroscopy technique |
| Paper # | ED94-27,CPM94-28 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1994/5/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Electrical effects of growth interruption in Liquid-Phase Epitaxial Al_xGa_1-x>Sb |
| Sub Title (in English) | |
| Keyword(1) | Al_xGa_1-x>Sb |
| Keyword(2) | Liquid Phase Epitaxy |
| Keyword(3) | growth-interruption interface |
| Keyword(4) | current-voltage characteristic |
| Keyword(5) | deep level transient spectroscopy technique |
| 1st Author's Name | Hiroyasu Ogino |
| 1st Author's Affiliation | Department of Electrical and Computer Engineering,Nagoya Institute of Technology() |
| 2nd Author's Name | Masaya Ichimura |
| 2nd Author's Affiliation | Department of Electrical and Computer Engineering,Nagoya Institute of Technology |
| 3rd Author's Name | Akira Usami |
| 3rd Author's Affiliation | Department of Electrical and Computer Engineering,Nagoya Institute of Technology |
| 4th Author's Name | Takao Wada |
| 4th Author's Affiliation | Daido Institute of Technology |
| Date | 1994/5/20 |
| Paper # | ED94-27,CPM94-28 |
| Volume (vol) | vol.94 |
| Number (no) | 47 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |