Presentation 1994/5/20
Improvement of crystalline quallity in regrown GaAs on AlGaAs using a novel two-step HCl gas etching process
Hirotaka Kizuki, Nariaki Fujii, Motoharu Miyashita, Yutaka Mihashi, Sabro Takamiya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A combined process,namely the two-step HCl gas etching and the following MOCVD regrowth,is newly developed.The two-step HCl gas etching consists of low-temperature HCl gastreatment(LTT)and succeeding high-temperature HCl gas etching.Using the two-step HCl gas etching process,no carbon accumulation was detected at the interface between the regrown GaAs layer and the etched Al_0.48> Ga_0.52>As surface.Oxygen accumulation at the regrowth interface was reduced to less than one fifth by applying the LTT.The dislocation density of the regrown GaAs layer was shown to be comparable to that found in the usual GaAs homoepitaxial layer.The results of carrier lifetime measurements in GaAs, AlGaAs regrown DH structures indicated the excellent quality of both the regrown GaAs layer and heterointerfaces.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) low temperature HCl gas treament / in situ process / gas etching / regrowth on AlGaAs / MOCVD
Paper # ED94-22,CPM94-23
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Committee ED
Conference Date 1994/5/20(1days)
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Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improvement of crystalline quallity in regrown GaAs on AlGaAs using a novel two-step HCl gas etching process
Sub Title (in English)
Keyword(1) low temperature HCl gas treament
Keyword(2) in situ process
Keyword(3) gas etching
Keyword(4) regrowth on AlGaAs
Keyword(5) MOCVD
1st Author's Name Hirotaka Kizuki
1st Author's Affiliation Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation()
2nd Author's Name Nariaki Fujii
2nd Author's Affiliation Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
3rd Author's Name Motoharu Miyashita
3rd Author's Affiliation Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
4th Author's Name Yutaka Mihashi
4th Author's Affiliation Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
5th Author's Name Sabro Takamiya
5th Author's Affiliation Optoelectronic & Microwave Devices Laboratory Mitsubishi Electric Corporation
Date 1994/5/20
Paper # ED94-22,CPM94-23
Volume (vol) vol.94
Number (no) 47
Page pp.pp.-
#Pages 8
Date of Issue