Presentation 1994/5/20
Redistribution of Er atoms in Si during Laser Doping
Osamu Eryu, Hironori Ohwaki, Kenshirou Nakashima,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The distribution and the location of Er atoms in Si,which have been doped by means of pulsed laser doping method with an Excimer laser(λ=248nm,τp=20ns)and a Dye laser(λ=584nm,τp=500ns),is dete rmined using Rutherford backscattering spectrometry and the angular yield-profile measurements of channeling.Crystallinity of Si at the Er doped region have also been investigated.These experiments proved that the lattice location of Er atoms strongly depend on the pusled laser parameters.That is,clustering of Er atoms has been occurred within a Si by Excimer laser irradiation, while the ordering of Er atoms at the location of hexagonal sites and tetrahedral sites in Si has beenobserved in the case of Dye laser inadiation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) pulsed laser doping / Rutherford backscattering spectroscopy / channeling
Paper # ED94-18,CPM94-19
Date of Issue

Conference Information
Committee ED
Conference Date 1994/5/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Redistribution of Er atoms in Si during Laser Doping
Sub Title (in English)
Keyword(1) pulsed laser doping
Keyword(2) Rutherford backscattering spectroscopy
Keyword(3) channeling
1st Author's Name Osamu Eryu
1st Author's Affiliation Department of Electrical and Computer Engineering,Nagoya institute of Technology()
2nd Author's Name Hironori Ohwaki
2nd Author's Affiliation Department of Electrical and Computer Engineering,Nagoya institute of Technology
3rd Author's Name Kenshirou Nakashima
3rd Author's Affiliation Department of Electrical and Computer Engineering,Nagoya institute of Technology
Date 1994/5/20
Paper # ED94-18,CPM94-19
Volume (vol) vol.94
Number (no) 47
Page pp.pp.-
#Pages 8
Date of Issue