Presentation 1994/10/11
Surface Passivation of Compound Semiconductor Quantum Well Structure Using Silicon Interface Control Layer
Satoshi Kodama, Satoshi Koyanagi, Tamotsu Hashizume, Hideki Hasegawa,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A novel passivation scheme using ultrathin MBE silicon interface control layer (ICL) and ultra thin silicon nitride layer is investigated for use in passivation of the compound semiconductor quantum structures.Process optimization was made by in-situ X-ray photoelectron spectroscopy and electrical characterization of Insulatorsemiconductor interface formed on In_0.53>Ga_0.47>As.A drastic reduction of interface state density into 10^10>cm^-2>・ eV^-1> range was obtained under optimum condition.The passivation scheme was then applied to passivation of Al_0.3>Ga_0.7>As, GaAs near-surface quantum wells.Remarkable recovery of photoluminescence (PL) intensity was observed by application of the present passivation scheme on the barrier surface,being consistent with the reduction of surface states.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) near-surface quantum well / passivation / interface control layer / surface state / DIGS model
Paper # ED94-67
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Committee ED
Conference Date 1994/10/11(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Surface Passivation of Compound Semiconductor Quantum Well Structure Using Silicon Interface Control Layer
Sub Title (in English)
Keyword(1) near-surface quantum well
Keyword(2) passivation
Keyword(3) interface control layer
Keyword(4) surface state
Keyword(5) DIGS model
1st Author's Name Satoshi Kodama
1st Author's Affiliation Faculty of Engineering,Hokkaido University()
2nd Author's Name Satoshi Koyanagi
2nd Author's Affiliation Faculty of Engineering,Hokkaido University
3rd Author's Name Tamotsu Hashizume
3rd Author's Affiliation Faculty of Engineering,Hokkaido University
4th Author's Name Hideki Hasegawa
4th Author's Affiliation Research Center for Interface Quantum Electronics,Faculty of Engineering,Hokkaido University
Date 1994/10/11
Paper # ED94-67
Volume (vol) vol.94
Number (no) 268
Page pp.pp.-
#Pages 8
Date of Issue