Presentation 1998/5/22
DLTS study of 3C-SiC grown on Si substrates : Defects observable above room temperature
M Kato, Y Koga, M Ichimura, E Arai, N Yamada,
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Abstract(in English) n-type 3C-SiC was grown on Si(100) substrates by chemical vapor deposition. In order to observe defects located near the middle of the band gap, the DLTS measurement was carried out in a temperature range from 100K to 600K. A DLTS peak appeared near 150K for all the samples. Some samples showed a peak near room temperature, but the width and position of this peak were different between samples. One of the samples showed a broad peak near 500K. This peak was attributed to deep defects whose activation energy is in the range of 1.07-1.35eV.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 3C-SiC / DLTS / deep level
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Conference Date 1998/5/22(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) DLTS study of 3C-SiC grown on Si substrates : Defects observable above room temperature
Sub Title (in English)
Keyword(1) 3C-SiC
Keyword(2) DLTS
Keyword(3) deep level
1st Author's Name M Kato
1st Author's Affiliation Nagoya Inst.Tech()
2nd Author's Name Y Koga
2nd Author's Affiliation Nagoya Inst.Tech
3rd Author's Name M Ichimura
3rd Author's Affiliation Nagoya Inst.Tech
4th Author's Name E Arai
4th Author's Affiliation Nagoya Inst.Tech
5th Author's Name N Yamada
5th Author's Affiliation Nagoya Inst.Tech, Toyota Central Lab.
Date 1998/5/22
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Volume (vol) vol.98
Number (no) 60
Page pp.pp.-
#Pages 6
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