Presentation 1998/5/22
Hetero Epitaxial Growth of Indium Nitride Films on Al_2O_3(11-20)
Hisao Saiki, Masato Onishi, Kouji Shimada, Jyun Gemba, Akihiro Wakahara, Akira Yoshida,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have made an effort to improve crystalline and electrical properties of InN on Al_2O_3(11-20). For preparing InN films, microwave excited metalorganic vapor phase epitaxy[ME-MOVPE] using trimethylindium[TMIn] and nitrogen remoto plasma was employed. The crystal quality of the InN thin film was characterized with the double-crystal X-ray rocking curve [XRC]. The Full width at half maximam(FWHM) for (0002) diffraction from the InN/Al_2O_3(11-20) thin films became about 110 arcsec. By adapoting a low temparature grown InN bufer layer, the FWHM of XRC was narrower them that of direct growth.
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Keyword(in English) InN / epitaxy / Al_2O_3(11-20) substrate / baffer layer
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Conference Date 1998/5/22(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Hetero Epitaxial Growth of Indium Nitride Films on Al_2O_3(11-20)
Sub Title (in English)
Keyword(1) InN
Keyword(2) epitaxy
Keyword(3) Al_2O_3(11-20) substrate
Keyword(4) baffer layer
1st Author's Name Hisao Saiki
1st Author's Affiliation Sanyo Electric Works Ltd()
2nd Author's Name Masato Onishi
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name Kouji Shimada
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name Jyun Gemba
4th Author's Affiliation Toyohashi University of Technology
5th Author's Name Akihiro Wakahara
5th Author's Affiliation Toyohashi University of Technology
6th Author's Name Akira Yoshida
6th Author's Affiliation Toyohashi University of Technology
Date 1998/5/22
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Volume (vol) vol.98
Number (no) 60
Page pp.pp.-
#Pages 6
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