Presentation 1993/11/18
Step structure and formation during MOCVD growth of GaAs and AlAs.
Masanori Shinohara, Masafumi Tanimoto, Haruki Yokoyama, Jiro Oosaka, Naohisa Inoue,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The behavior and mechanism of step formation process during MOCVD growth of GaAs and AlAs on(100)just surfaces are investigated.The steps are formed during thermal cleaning for removing surface oxide.The steps are formed in the£100! direction and the terrace width is determined by the diffusion length of As. The step structure during GaAs growth strongly depends on the step structure formed in the thermal process.The wide terrace width of more than 0.5μm and monolayer step flow growth are reproducibly ob tained using TEG and TMA as well as TMG. The critical substrate terrace width at which step bunching occurs exists for the growth on vicinal substrate surfaces. Variation of step barrier potentials depending on the terrace width and the effective diffusion length of Ga atoms are thought to play an important role in causing step bunching.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MOCVD / GaAs / AlAs / AFM / Surface step / step flow growth
Paper # ED93-113,CPM93-84
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Committee ED
Conference Date 1993/11/18(1days)
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Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Step structure and formation during MOCVD growth of GaAs and AlAs.
Sub Title (in English)
Keyword(1) MOCVD
Keyword(2) GaAs
Keyword(3) AlAs
Keyword(4) AFM
Keyword(5) Surface step
Keyword(6) step flow growth
1st Author's Name Masanori Shinohara
1st Author's Affiliation NTT LSI Laboratories()
2nd Author's Name Masafumi Tanimoto
2nd Author's Affiliation NTT LSI Laboratories
3rd Author's Name Haruki Yokoyama
3rd Author's Affiliation NTT LSI Laboratories
4th Author's Name Jiro Oosaka
4th Author's Affiliation NTT LSI Laboratories
5th Author's Name Naohisa Inoue
5th Author's Affiliation NTT LSI Laboratories
Date 1993/11/18
Paper # ED93-113,CPM93-84
Volume (vol) vol.93
Number (no) 325
Page pp.pp.-
#Pages 6
Date of Issue