| Presentation | 1993/6/24 Dynamic Characterization Method for Load Capacitances of Chort- channel CMOS Circuits on Low Voltage Operation Minoru Fujishima, Kunihiro Asada, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A reliable characterization method is proposed for evaluating effective load capacitance,effective current drivability and effective leak current in dynamic operation.In this method,two test structures are utilized in order to make the evaluation reliable;one is an open-loop inverter array for extracting parameters and the other is a conventional closed-loop ring oscillator for confirmation.The method is easily extended for general high-speed circuits such as ECL and compound-semiconductor circuits though CMOS circuits are used in this paper. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | CMOS / Characterization / Low Voltage / Short channel |
| Paper # | ED93-35,ICD93-34 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1993/6/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Dynamic Characterization Method for Load Capacitances of Chort- channel CMOS Circuits on Low Voltage Operation |
| Sub Title (in English) | |
| Keyword(1) | CMOS |
| Keyword(2) | Characterization |
| Keyword(3) | Low Voltage |
| Keyword(4) | Short channel |
| 1st Author's Name | Minoru Fujishima |
| 1st Author's Affiliation | Faculty of Engineering,the University of Tokyo() |
| 2nd Author's Name | Kunihiro Asada |
| 2nd Author's Affiliation | Faculty of Engineering,the University of Tokyo |
| Date | 1993/6/24 |
| Paper # | ED93-35,ICD93-34 |
| Volume (vol) | vol.93 |
| Number (no) | 111 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |