Presentation 1993/5/20
Characterization of CuInS_2 thin films fabricated by sulfulization
Yoshitaka Ogawa, Shouichi Uenishi, Kentaro Ito,
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Abstract(in English) The compound semiconductor of CuInS_2 with chalcopyrite structure has an optimum energy band gap of 1.5 eV for the photon absorber of solar cells.We measured the electrical characteristics of the CuInS_2 thin films which are fabricated by sulfulization of precursor Cu-In layers deposited on glass substrates.The film resistivity was decreased gradually when the film was exposed in room ambient.It was revealed by Hall measurements that the decrease in the resistivity was caused by the increase in the hole mobility of the film.A thin film exposed to room air for about two hundred days had the hole concentration of 1.96x10^20> cm^-3> and the hole mobility of 0.36 cm^2, Vs.After annealing in vacuum, the hole concentration did not change but the hole mobility decreased.These experimental findings seem to suggest that the electrical conduction in the film is influenced by absorbed gaseous molecules at the grain boundaries of the film.
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Keyword(in English) CuInS^2 thin films / ageing effect / hole moblity / hole concentration / annealing
Paper # ED93-18,CPM93-9
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Committee ED
Conference Date 1993/5/20(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Characterization of CuInS_2 thin films fabricated by sulfulization
Sub Title (in English)
Keyword(1) CuInS^2 thin films
Keyword(2) ageing effect
Keyword(3) hole moblity
Keyword(4) hole concentration
Keyword(5) annealing
1st Author's Name Yoshitaka Ogawa
1st Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Shinshu University()
2nd Author's Name Shouichi Uenishi
2nd Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Shinshu University
3rd Author's Name Kentaro Ito
3rd Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Shinshu University
Date 1993/5/20
Paper # ED93-18,CPM93-9
Volume (vol) vol.93
Number (no) 45
Page pp.pp.-
#Pages 7
Date of Issue