Presentation | 1993/5/20 TEM and CL observations of CdZnSe/ZnSe SCH structure Yasuhito Takahashi, Tadashi Narusawa, Shigeo Hayashi, Kazuhiro Ohkawa, Tuneo Mitsuyu, Yasufumi Yabuuchi, Hiroshi Saijyo, Toshiyuki Ishiki, Makoto Shiojiri, Gang Ning, Kazuo Ogawa, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | CdZnSe, ZnSe SCH structures grown by MBE were observed by equal thickness fringe,cross-sectional TEM and analytical color fluorescence electron microscope(ACEM).It was found that the ZnSe guide layers as well as active layer were strongly strained around 20nm from interfaces.In spite of existence of large strain around both inferfaces of active layer,interfaces are very smooth and atomic level defects can not be detected.From CL metod,deep level luminescenses were observed in n-ZnSSe near GaAs substrate. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | CdZnSe/nSe SCH structure / equal thickness fringe / XTEM / CL |
Paper # | ED93-16,CPM93-7 |
Date of Issue |
Conference Information | |
Committee | ED |
---|---|
Conference Date | 1993/5/20(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Electron Devices (ED) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | TEM and CL observations of CdZnSe/ZnSe SCH structure |
Sub Title (in English) | |
Keyword(1) | CdZnSe/nSe SCH structure |
Keyword(2) | equal thickness fringe |
Keyword(3) | XTEM |
Keyword(4) | CL |
1st Author's Name | Yasuhito Takahashi |
1st Author's Affiliation | Semiconductor Research Center,Matsushita Electric Industrial Co. Ltd.() |
2nd Author's Name | Tadashi Narusawa |
2nd Author's Affiliation | Semiconductor Research Center,Matsushita Electric Industrial Co. Ltd. |
3rd Author's Name | Shigeo Hayashi |
3rd Author's Affiliation | Central Research Laboratory,Matsushita,Electric Industrial Co.Ltd. |
4th Author's Name | Kazuhiro Ohkawa |
4th Author's Affiliation | Central Research Laboratory,Matsushita,Electric Industrial Co.Ltd. |
5th Author's Name | Tuneo Mitsuyu |
5th Author's Affiliation | Central Research Laboratory,Matsushita,Electric Industrial Co.Ltd. |
6th Author's Name | Yasufumi Yabuuchi |
6th Author's Affiliation | Matsushita Technoresearch |
7th Author's Name | Hiroshi Saijyo |
7th Author's Affiliation | Department of Electronics and Information Science,Faculty of Engineering and Design,Kyoto Institute of Technology |
8th Author's Name | Toshiyuki Ishiki |
8th Author's Affiliation | Department of Electronics and Information Science,Faculty of Engineering and Design,Kyoto Institute of Technology |
9th Author's Name | Makoto Shiojiri |
9th Author's Affiliation | Department of Electronics and Information Science,Faculty of Engineering and Design,Kyoto Institute of Technology |
10th Author's Name | Gang Ning |
10th Author's Affiliation | Department of Anatomy,Faculty of Medicine,Kyoto University |
11th Author's Name | Kazuo Ogawa |
11th Author's Affiliation | Department of Anatomy,Faculty of Medicine,Kyoto University |
Date | 1993/5/20 |
Paper # | ED93-16,CPM93-7 |
Volume (vol) | vol.93 |
Number (no) | 45 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |