Presentation 1995/12/14
Experimental study of Flicker noise of Si FEAs
Sarsembinov Dias, Shigehiko Yamamoto, Junji Itoh, Seigo Kanemaru, Takayuki Hirano,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The Si field emitter arrays (FEAs) were fabricated using microfabrication technique and basic observation of field emission flicker noise (FN) has been done. The spectral density function of mean square fluctuation of FN was found as W(f,I)∝I^2xf^<-ε> with cutoff frequency f_0=1 Hz. The main objective of the experiment is to investigate the parameter ε of FN in frequency range 1-100 Hz. The ε of FN slightly changes with emission current under UHV conditions, but doesn't relate to number of tips and stabilizing resistance. Furthermore, dependence on ambient pressure also could not been detected. The ε-parameter corresponds to surface diffusion of adsorbed molecules of residual gases and changes under different ambient gases. The ε=1 and 1.5 were found for H_2 and CO respectively. Appropriate model of surface diffusion is discussed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Field emitter arrays / Flicker noise / spectral density function / surface diffusion / hydrogen / carbon monoxide
Paper # ED95-130
Date of Issue

Conference Information
Committee ED
Conference Date 1995/12/14(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electron Devices (ED)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Experimental study of Flicker noise of Si FEAs
Sub Title (in English)
Keyword(1) Field emitter arrays
Keyword(2) Flicker noise
Keyword(3) spectral density function
Keyword(4) surface diffusion
Keyword(5) hydrogen
Keyword(6) carbon monoxide
1st Author's Name Sarsembinov Dias
1st Author's Affiliation Tsukuba University()
2nd Author's Name Shigehiko Yamamoto
2nd Author's Affiliation Tsukuba University
3rd Author's Name Junji Itoh
3rd Author's Affiliation Electrotechnical Laboratory
4th Author's Name Seigo Kanemaru
4th Author's Affiliation Electrotechnical Laboratory
5th Author's Name Takayuki Hirano
5th Author's Affiliation Kobe Steel Ltd.
Date 1995/12/14
Paper # ED95-130
Volume (vol) vol.95
Number (no) 424
Page pp.pp.-
#Pages 8
Date of Issue