Presentation | 1995/6/22 A 50% Active Power Saving Circuit without Speed Degradation (Invited) Tadahiro Kuroda, Katsuhiko Seta, Hiroyuki Hara, Masakazu Kakumu, Takayasu Sakurai, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A standby power reduction (SPR) scheme is presented where a substrate bias is applied in a standby mode to increase the threshold voltage. While in an active mode, a substrate bias is not applied which assures high-speed operation. An SPR circuit is proposed and designed using 0.3μm CMOS technology. By lowering the supply voltage and the threshold voltage at the same time, 50% active power reduction is achieved while maintaining the speed and the standby power. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | CMOS / low-power dissipation / low-voltage / low-threshold / substrate bias |
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Committee | ED |
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Conference Date | 1995/6/22(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A 50% Active Power Saving Circuit without Speed Degradation (Invited) |
Sub Title (in English) | |
Keyword(1) | CMOS |
Keyword(2) | low-power dissipation |
Keyword(3) | low-voltage |
Keyword(4) | low-threshold |
Keyword(5) | substrate bias |
1st Author's Name | Tadahiro Kuroda |
1st Author's Affiliation | Toshiba Corp. Semiconductor Device Engineering Lab.() |
2nd Author's Name | Katsuhiko Seta |
2nd Author's Affiliation | Toshiba Corp. Semiconductor Device Engineering Lab. |
3rd Author's Name | Hiroyuki Hara |
3rd Author's Affiliation | Toshiba Corp. Semiconductor Device Engineering Lab. |
4th Author's Name | Masakazu Kakumu |
4th Author's Affiliation | Toshiba Corp. Semiconductor Device Engineering Lab. |
5th Author's Name | Takayasu Sakurai |
5th Author's Affiliation | Toshiba Corp. Semiconductor Device Engineering Lab. |
Date | 1995/6/22 |
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Volume (vol) | vol.95 |
Number (no) | 116 |
Page | pp.pp.- |
#Pages | 7 |
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