| Presentation | 1996/12/13 Emission Characteristics of Si-MOS Electron Tunneling Cathode Y. Abe, J. Ikeda, K. Tahara, K. Sagae, H. Mimura, K. Yokoo, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The paper describes the emission characteristics of Si-MOS electron tunneling cathodes with various oxide thickness and discusses the energy distribution of the emitted electrons. The experimental results suggests that electrons tunnel through the oxide barrier from the valence band of Si-substrates, as well as from the conduction band. In addition, we have fabricated the cesiated Si-MOS cathodes and measured the energy distribution of the emitted electrons in order to investigate the conduction mechanism of tunneling electrons with lower energy. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | NIOS diode / tunneling cathode / energy distribution / work function / Cesiation |
| Paper # | ED96-142 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1996/12/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Emission Characteristics of Si-MOS Electron Tunneling Cathode |
| Sub Title (in English) | |
| Keyword(1) | NIOS diode |
| Keyword(2) | tunneling cathode |
| Keyword(3) | energy distribution |
| Keyword(4) | work function |
| Keyword(5) | Cesiation |
| 1st Author's Name | Y. Abe |
| 1st Author's Affiliation | Research Institute of Electrical Communication, Tohoku Univ.() |
| 2nd Author's Name | J. Ikeda |
| 2nd Author's Affiliation | R&D Headquarters, NIKON Corp. |
| 3rd Author's Name | K. Tahara |
| 3rd Author's Affiliation | Research Institute of Electrical communication, Tohoku Univ. |
| 4th Author's Name | K. Sagae |
| 4th Author's Affiliation | Research Institute of Electrical communication, Tohoku Univ. |
| 5th Author's Name | H. Mimura |
| 5th Author's Affiliation | Research Institute of Electrical communication, Tohoku Univ. |
| 6th Author's Name | K. Yokoo |
| 6th Author's Affiliation | Research Institute of Electrical communication, Tohoku Univ. |
| Date | 1996/12/13 |
| Paper # | ED96-142 |
| Volume (vol) | vol.96 |
| Number (no) | 412 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |