| Presentation | 1997/7/15 Ballistic Electron Emission Microscopy Studies of Inhomogeneity in Au/CaF_2/n- Si(111) Interfaces Touru SUMIYA, Tadao MIURA, Shun-ichiro Tanaka, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have performed ballistic electron emission microscopy (BEEM) measurements on the Au/CaF_2/n-Si(111) system in which calcium fluoride (CaF_2) (about 2 monolayers (ML)) was introduced at the Au/Si interface. A BEEM image clearly shows the coexistence of two types of terrace. A typical barrier height for one type is about 0.75 eV. In contrast, the second type shows a barrier height of about 3.5 eV. We attribute the coexistence of the two types of terrace in the BEEM image to the different degrees of coverage of the CaF_2 intralayers. At the second type of terrace, a Au/2 ML CaF_2/1ML CaF/Si(111) interface exists, although the first type has a Au/1 ML CaF/Si(111) interface without a CaF_2 intralayer. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | interface / BEEM / barrier height / gold / calcium fluoride / silicon |
| Paper # | ED97-78 |
| Date of Issue |
| Conference Information | |
| Committee | ED |
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| Conference Date | 1997/7/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Ballistic Electron Emission Microscopy Studies of Inhomogeneity in Au/CaF_2/n- Si(111) Interfaces |
| Sub Title (in English) | |
| Keyword(1) | interface |
| Keyword(2) | BEEM |
| Keyword(3) | barrier height |
| Keyword(4) | gold |
| Keyword(5) | calcium fluoride |
| Keyword(6) | silicon |
| 1st Author's Name | Touru SUMIYA |
| 1st Author's Affiliation | Tanaka Solid Junction Project, ERATO, Japan Science and Technology Corporation() |
| 2nd Author's Name | Tadao MIURA |
| 2nd Author's Affiliation | Tanaka Solid Junction Project, ERATO, Japan Science and Technology Corporation |
| 3rd Author's Name | Shun-ichiro Tanaka |
| 3rd Author's Affiliation | Tanaka Solid Junction Project, ERATO, Japan Science and Technology Corporation |
| Date | 1997/7/15 |
| Paper # | ED97-78 |
| Volume (vol) | vol.97 |
| Number (no) | 159 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |