| Presentation | 2001/12/14 Analog BOST(Built-Out Self-Test) : Super low-cost analog test technology of a system LSI era Hidekazu NAGASAWA, Hisayoshi HANAI, Eisaku YAMASHITA, Teruhiko FUNAKURA, Hisaya MORI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | While the various test methods are proposed with multi-functionalization of a system LSI, paying attention to the method of BOST(Built-Out Self Test), the low-cost test solution using the logic tester is proposed and proved as the test technique of an analog circuit portion. It is offering the analog test of high precision with a low-cost tester, and a short time to complication of the test process that uses the conventional highly efficient mixed signal tester and the tester according to the function as a feature of this technique, and it is possible to realize curtailment of plant-and-equipment investment. In this paper, while proposing the basic function of Analog BOST, verfication result of the effect is introduced. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BOST / System LSI / Self Test / Analog Test / Low-cost testing |
| Paper # | CPM-128,ICD-180 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2001/12/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analog BOST(Built-Out Self-Test) : Super low-cost analog test technology of a system LSI era |
| Sub Title (in English) | |
| Keyword(1) | BOST |
| Keyword(2) | System LSI |
| Keyword(3) | Self Test |
| Keyword(4) | Analog Test |
| Keyword(5) | Low-cost testing |
| 1st Author's Name | Hidekazu NAGASAWA |
| 1st Author's Affiliation | Department of Test Engineering Manufacturing & Techonology Production Management Division Mitsubishi Electric Corporation() |
| 2nd Author's Name | Hisayoshi HANAI |
| 2nd Author's Affiliation | Department of Test Engineering Manufacturing & Techonology Production Management Division Mitsubishi Electric Corporation |
| 3rd Author's Name | Eisaku YAMASHITA |
| 3rd Author's Affiliation | Department of Test Engineering Manufacturing & Techonology Production Management Division Mitsubishi Electric Corporation:Ryoden Semiconductor System Engineering Corporation |
| 4th Author's Name | Teruhiko FUNAKURA |
| 4th Author's Affiliation | Department of Test Engineering Manufacturing & Techonology Production Management Division Mitsubishi Electric Corporation |
| 5th Author's Name | Hisaya MORI |
| 5th Author's Affiliation | Department of Test Engineering Manufacturing & Techonology Production Management Division Mitsubishi Electric Corporation:Ryoden Semiconductor System Engineering Corporation |
| Date | 2001/12/14 |
| Paper # | CPM-128,ICD-180 |
| Volume (vol) | vol.101 |
| Number (no) | 517 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |