Presentation 2001/10/19
Low Temperature Epitaxial Growth of 3C-SiC by Triode Plasma CVD Using Dimethylsilane and Hydrogen
Masahiro HASHIBA, Tomohiko MAEDA, Kanji YASUI, Tadashi AKAHANE,
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Abstract(in English) The cubic-silicon carbide(3C-SiC) were grown at low temperatures on Si substrates by triode plasma CVD. By the high density hydrogen radicals generated by rf plasma, epitaxial growth at 900℃ was realized, while the growth by low pressure CVD was realized at higher than 950℃ . The activation energy of epitaxial growth rate was 48kcal/mol, which was about 25kcal/mol smaller than that of low pressure CVD.
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Keyword(in English) silicon carbide / epitaxial growth / triode plasma CVD / dimethylsilane
Paper # CPM2001-112
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Committee CPM
Conference Date 2001/10/19(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Low Temperature Epitaxial Growth of 3C-SiC by Triode Plasma CVD Using Dimethylsilane and Hydrogen
Sub Title (in English)
Keyword(1) silicon carbide
Keyword(2) epitaxial growth
Keyword(3) triode plasma CVD
Keyword(4) dimethylsilane
1st Author's Name Masahiro HASHIBA
1st Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology()
2nd Author's Name Tomohiko MAEDA
2nd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
3rd Author's Name Kanji YASUI
3rd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
4th Author's Name Tadashi AKAHANE
4th Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
Date 2001/10/19
Paper # CPM2001-112
Volume (vol) vol.101
Number (no) 395
Page pp.pp.-
#Pages 6
Date of Issue