Presentation 2000/11/30
Evaluation of the DRAM manufacturing process with wafer-level-CSP technology through simulation analysis
M. Tanabe, K. Nakamae, H. Fujioka,
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Abstract(in English) The wafer level chip size packaging process(WLCSP)is a new technology in which all of the IC packaging is performed at the wafer level. A WLCSP technology could maintain the cost of the IC packaging as a constant percentage of the total wafer cost since WLCSP reduces the cost of packaging the individual chips. In this paper, the effect of WLCSP on turnaround time (TAT)and cost is evaluated through an event-driven simulation analysis where the WLCSP for 64M DRAM is assumed. Results shows that the TAT and cost are reduced by about 20% and 15% respectively compared with those in the conventional wafer test, assembly and final test processes.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Wafer-level-CSP / Packaging technology / simulation / TAT / cost
Paper # CPM2000-140,ICD2000-173
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Committee CPM
Conference Date 2000/11/30(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of the DRAM manufacturing process with wafer-level-CSP technology through simulation analysis
Sub Title (in English)
Keyword(1) Wafer-level-CSP
Keyword(2) Packaging technology
Keyword(3) simulation
Keyword(4) TAT
Keyword(5) cost
1st Author's Name M. Tanabe
1st Author's Affiliation Department of Information Systems Engineering, Faculty of Engineering, Osaka University()
2nd Author's Name K. Nakamae
2nd Author's Affiliation Department of Information Systems Engineering, Faculty of Engineering, Osaka University
3rd Author's Name H. Fujioka
3rd Author's Affiliation Department of Information Systems Engineering, Faculty of Engineering, Osaka University
Date 2000/11/30
Paper # CPM2000-140,ICD2000-173
Volume (vol) vol.100
Number (no) 485
Page pp.pp.-
#Pages 7
Date of Issue