Presentation 2000/11/30
Silicon Interposer Technology for High-density Package
Mie Matsuo, Nobuo Hayasaka, Katsuya Okumura, Chiaki Takubo, Eiichi Hosomi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The achievement of rapid advances in integration density and performance of LSI devices is predicated on shrinking design rule of wiring and bump pitch on the organic substrate of a flip-chip package. However, decreasing the bump pitch and wiring rule raises the process cost of fabricating organic substrate. Moreover, it is difficult to obtain highly reliable connections between chip and organic substrate with smaller bumps due to the mismatching of the coefficient of the thermal expansion(CTE). To overcome these problems, a new interposer using silicon(Si)substrate with through plug is developed. The silicon interposer consists of a copper(Cu) / low relative dielectric constant(low-k)material interconnections and Cu through plugs in Si substrate. To fabricate interposer, high rate Si reactive ion etching(RIE)and Cu / low-k interconnections technologies are developed. In the demonstrated silicon interposer, the 10μm-pitch lines had 0.18dB/mm of attenuation and 8.5psec/mm of propagation delay at the frequency of 1GHz. The silicon interposer is a promising solution for future high-density flip-chip packaging.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Flip-chip-BGA / interposer / CTE / through plug / damascene / electrical character
Paper # CPM2000-138,ICD2000-171
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Conference Information
Committee CPM
Conference Date 2000/11/30(1days)
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Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Silicon Interposer Technology for High-density Package
Sub Title (in English)
Keyword(1) Flip-chip-BGA
Keyword(2) interposer
Keyword(3) CTE
Keyword(4) through plug
Keyword(5) damascene
Keyword(6) electrical character
1st Author's Name Mie Matsuo
1st Author's Affiliation Process and Manufacturing Engineering Center Semiconductor Company, TOSHIBA Corp.()
2nd Author's Name Nobuo Hayasaka
2nd Author's Affiliation Process and Manufacturing Engineering Center Semiconductor Company, TOSHIBA Corp.
3rd Author's Name Katsuya Okumura
3rd Author's Affiliation Process and Manufacturing Engineering Center Semiconductor Company, TOSHIBA Corp.
4th Author's Name Chiaki Takubo
4th Author's Affiliation Process and Manufacturing Engineering Center Semiconductor Company, TOSHIBA Corp.
5th Author's Name Eiichi Hosomi
5th Author's Affiliation Process and Manufacturing Engineering Center Semiconductor Company, TOSHIBA Corp.
Date 2000/11/30
Paper # CPM2000-138,ICD2000-171
Volume (vol) vol.100
Number (no) 485
Page pp.pp.-
#Pages 6
Date of Issue