Presentation 2000/10/19
Evaluation of ultra thin AIN epitaxial-layer on NbN by noise and tunnel spectroscopies
N. Masumoto, H. Ishida, A. Saito, K. Hamasaki, Z. Wang,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) 1/f noise properties in epitaxial NbN/AlN/NbN tunnel junctions on single-crystal(100)MgO substrated have been investigated. We found that the level of the 1/f noise was greatly decreased as decreasing the barrier thickness(as increasing the critical current density J_c), and monotonically decreased as decreasing the device quality factor Q.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 1/f noise / Andreev reflection probability / epitaxial AlN layer / NbN/AlN/NbN tunnel junction
Paper # CPM2000-121
Date of Issue

Conference Information
Committee CPM
Conference Date 2000/10/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of ultra thin AIN epitaxial-layer on NbN by noise and tunnel spectroscopies
Sub Title (in English)
Keyword(1) 1/f noise
Keyword(2) Andreev reflection probability
Keyword(3) epitaxial AlN layer
Keyword(4) NbN/AlN/NbN tunnel junction
1st Author's Name N. Masumoto
1st Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology()
2nd Author's Name H. Ishida
2nd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
3rd Author's Name A. Saito
3rd Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
4th Author's Name K. Hamasaki
4th Author's Affiliation Department of Electrical Engineering, Nagaoka University of Technology
5th Author's Name Z. Wang
5th Author's Affiliation KARC Communications Research Laboratory
Date 2000/10/19
Paper # CPM2000-121
Volume (vol) vol.100
Number (no) 395
Page pp.pp.-
#Pages 6
Date of Issue