Presentation 2000/6/16
CPM2000-31 Thin gate SiC Schottky diode: Study on yield and Characterization for Sensor application
Shabbir A. Khan, Vasconcelos Elder A. de, W.Y. Zhang, H. Uchida, Teruaki Katsube,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this report deals with successful operation of Schottky diode fabricated in non-epitaxial SiC and epitaxial SiC. A Schottky diode with a thin gate formed by 80%Pt20%Pd alloy showed some sensitivity to 200 ppm of NO gas at high temperature. This response needs further investigation. Yield study shows that SiC has the promising quality for fabrication Schottky diode. Back contact resistance for Ni and anneal at 850℃ in vacuum was reliably low. Use of the epitaxial SiC gives reasonably low series resistance. High temperature characterization shows epitaxial SiC has better performance.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Thin gate / Gas sensor / Schottky diode / Yield study / Parameter / Epitaxial wafer
Paper # CPM2000-31
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Conference Information
Committee CPM
Conference Date 2000/6/16(1days)
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Registration To Component Parts and Materials (CPM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) CPM2000-31 Thin gate SiC Schottky diode: Study on yield and Characterization for Sensor application
Sub Title (in English)
Keyword(1) Thin gate
Keyword(2) Gas sensor
Keyword(3) Schottky diode
Keyword(4) Yield study
Keyword(5) Parameter
Keyword(6) Epitaxial wafer
1st Author's Name Shabbir A. Khan
1st Author's Affiliation Dept. of Information and Computer Sciences, Saitama University()
2nd Author's Name Vasconcelos Elder A. de
2nd Author's Affiliation Dapartmento de Fisica, Universidae Federal de pernambuco
3rd Author's Name W.Y. Zhang
3rd Author's Affiliation Dept. of Information and Computer Sciences, Saitama University
4th Author's Name H. Uchida
4th Author's Affiliation Dept. of Information and Computer Sciences, Saitama University
5th Author's Name Teruaki Katsube
5th Author's Affiliation Dept. of Information and Computer Sciences, Saitama University
Date 2000/6/16
Paper # CPM2000-31
Volume (vol) vol.100
Number (no) 141
Page pp.pp.-
#Pages 4
Date of Issue