Presentation 1999/8/6
Effect of carrier gas composition on GaN layer grown by MOCVD
Y. Sasaki, K. 0htuka, K. Kuwahara, M. Sumiya, Y. Takano, S. Fuke,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) GaN layers were grown on sapphire (0001) substrates using a two-step growth method by MOCVD. Effects of the carrier gas composition at annealing process and GaN growth process on grown GaN layers were studied. When buffer layers were annealed in N_2+NH_3, no cohesion of the buffer layer took p lace and a lot of small nuclei were formed on a sapphire substrate. When GaN layers were grown in N_2+NH_3 ambient, little cohesion of the buffer layer were observed and many cracks were formed, in contrast to the GaN growth in H_2+NH_3 ambient. It is suggested that both the behavior of cohesion and the density of growth nuclei affect the crystallinity and the residual strain of GaN layers.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / MOCVD / sapphire substrates / GaN buffer layer / residual strain
Paper # CPM99-52
Date of Issue

Conference Information
Committee CPM
Conference Date 1999/8/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effect of carrier gas composition on GaN layer grown by MOCVD
Sub Title (in English)
Keyword(1) GaN
Keyword(2) MOCVD
Keyword(3) sapphire substrates
Keyword(4) GaN buffer layer
Keyword(5) residual strain
1st Author's Name Y. Sasaki
1st Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University()
2nd Author's Name K. 0htuka
2nd Author's Affiliation Research and Development Division, Sanken Electric Co.,Ltd.
3rd Author's Name K. Kuwahara
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University
4th Author's Name M. Sumiya
4th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University
5th Author's Name Y. Takano
5th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University
6th Author's Name S. Fuke
6th Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University
Date 1999/8/6
Paper # CPM99-52
Volume (vol) vol.99
Number (no) 257
Page pp.pp.-
#Pages 7
Date of Issue