Presentation 1999/8/6
STM Observation on Initial Oxidation of Si (111) Surface (2)
Masahiro Miyao, Nobuhiro Horiguchi, Hiroyuki Kikuchi, Tetsu Hasegawa,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Initial oxidation of Si(111) surfaces were studied by STM and STS. The silicon oxide occures concurrently duriling the oxidation of Si. The oxidation of Si is strongly affected by the some reactive spaces contained in the oxigen. These spaces are come from the operation of ion pomp.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si / Oxide layer / STS / STM / oxide formation mechanism / evapolation
Paper # CPM99-51
Date of Issue

Conference Information
Committee CPM
Conference Date 1999/8/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) STM Observation on Initial Oxidation of Si (111) Surface (2)
Sub Title (in English)
Keyword(1) Si
Keyword(2) Oxide layer
Keyword(3) STS
Keyword(4) STM
Keyword(5) oxide formation mechanism
Keyword(6) evapolation
1st Author's Name Masahiro Miyao
1st Author's Affiliation Muroran Inst. Tech.()
2nd Author's Name Nobuhiro Horiguchi
2nd Author's Affiliation Muroran Inst. Tech.
3rd Author's Name Hiroyuki Kikuchi
3rd Author's Affiliation Muroran Inst. Tech.
4th Author's Name Tetsu Hasegawa
4th Author's Affiliation Muroran Inst. Tech.
Date 1999/8/6
Paper # CPM99-51
Volume (vol) vol.99
Number (no) 257
Page pp.pp.-
#Pages 6
Date of Issue