Presentation | 1998/8/6 Growth and Electrical Characteristics of Ge-nanocrystals in SiO_2 Films Shigeyuki SAKUMA, Hisashi FUKUDA, Shigeru NOMURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The Ge-nanocrystals have been formed in silicon dioxide films using metal-organic decomposition(MOD)method at temperatures ranging from 600℃ to 1000℃ in N_2 ambient and the SiO_2/Ge/SiO_2 quantum well structures were fabricated. As-deposited Ge-nanocrystals was an amorphous state but were crystallized after annealing treatments. The Ge-nanocrystals were progressively crystallized with increasing annealing temperature. Capacitance-Voltage(C-V)characteristics showed good electrical properties at annealing temperature above 900℃. The quantum well devices whose Ge-nanocrystal size is within 5nm are expected to memory device application. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | metal-organic decomposition / Germanium / nanocrystal / quantum well |
Paper # | CPM98-66 |
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Conference Information | |
Committee | CPM |
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Conference Date | 1998/8/6(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Growth and Electrical Characteristics of Ge-nanocrystals in SiO_2 Films |
Sub Title (in English) | |
Keyword(1) | metal-organic decomposition |
Keyword(2) | Germanium |
Keyword(3) | nanocrystal |
Keyword(4) | quantum well |
1st Author's Name | Shigeyuki SAKUMA |
1st Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology() |
2nd Author's Name | Hisashi FUKUDA |
2nd Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology |
3rd Author's Name | Shigeru NOMURA |
3rd Author's Affiliation | Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology |
Date | 1998/8/6 |
Paper # | CPM98-66 |
Volume (vol) | vol.98 |
Number (no) | 236 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |