Presentation 1998/8/6
Growth and Electrical Characteristics of Ge-nanocrystals in SiO_2 Films
Shigeyuki SAKUMA, Hisashi FUKUDA, Shigeru NOMURA,
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Abstract(in English) The Ge-nanocrystals have been formed in silicon dioxide films using metal-organic decomposition(MOD)method at temperatures ranging from 600℃ to 1000℃ in N_2 ambient and the SiO_2/Ge/SiO_2 quantum well structures were fabricated. As-deposited Ge-nanocrystals was an amorphous state but were crystallized after annealing treatments. The Ge-nanocrystals were progressively crystallized with increasing annealing temperature. Capacitance-Voltage(C-V)characteristics showed good electrical properties at annealing temperature above 900℃. The quantum well devices whose Ge-nanocrystal size is within 5nm are expected to memory device application.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) metal-organic decomposition / Germanium / nanocrystal / quantum well
Paper # CPM98-66
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Committee CPM
Conference Date 1998/8/6(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth and Electrical Characteristics of Ge-nanocrystals in SiO_2 Films
Sub Title (in English)
Keyword(1) metal-organic decomposition
Keyword(2) Germanium
Keyword(3) nanocrystal
Keyword(4) quantum well
1st Author's Name Shigeyuki SAKUMA
1st Author's Affiliation Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology()
2nd Author's Name Hisashi FUKUDA
2nd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology
3rd Author's Name Shigeru NOMURA
3rd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty on Engineering, Muroran Institute of Technology
Date 1998/8/6
Paper # CPM98-66
Volume (vol) vol.98
Number (no) 236
Page pp.pp.-
#Pages 6
Date of Issue