| Presentation | 1998/12/10 Failure analysis methods of CSP packaged product with an E-beam prober at low temperature Yutaka Toyonoh, Akihiro Takegama, Hiroshi Takahashi, Atsushi Komoro, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have established failure analysis methods of a CSP(Chip Scale Package)packaged DSP(Digital Signal Processor), which had failures only at low temperature, with an E-beam prober. We succeeded in identifying the root cause of the failure by cooling the sample, through the test board & socket, inside the vacuum chamber of the E-beam prober. After decapping the sample, the bond wires were detached and the sample was then re-mounted on a ceramic PGA to reduce the thermal resistance between the test board and the sample. Using this method can save the cost to one hundredth and the time to a tenth for analysis. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Low temperature / CSP / E-beam prober / Fail analysis / DSP |
| Paper # | CPM98-154,ICD98-233 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 1998/12/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Failure analysis methods of CSP packaged product with an E-beam prober at low temperature |
| Sub Title (in English) | |
| Keyword(1) | Low temperature |
| Keyword(2) | CSP |
| Keyword(3) | E-beam prober |
| Keyword(4) | Fail analysis |
| Keyword(5) | DSP |
| 1st Author's Name | Yutaka Toyonoh |
| 1st Author's Affiliation | Texas instruments Japan limited., MS Shibaura Bldg.() |
| 2nd Author's Name | Akihiro Takegama |
| 2nd Author's Affiliation | Texas instruments Japan limited., MS Shibaura Bldg. |
| 3rd Author's Name | Hiroshi Takahashi |
| 3rd Author's Affiliation | Texas instruments Japan limited., MS Shibaura Bldg. |
| 4th Author's Name | Atsushi Komoro |
| 4th Author's Affiliation | Texas instruments Japan limited., MS Shibaura Bldg. |
| Date | 1998/12/10 |
| Paper # | CPM98-154,ICD98-233 |
| Volume (vol) | vol.98 |
| Number (no) | 456 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |