Presentation 1994/9/12
Application of amorphous Cu-Zr alloy films Combined with Zr or Zr- N layers for the Contact system of Cu/Si
Shinya Kagomi, Mayumi Takeyama, Atsushi Noya, Katsutaka Sasaki, Kouichirou Sakanshi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The barrier properties of the amorphous Cu-Zr alloy film combined with Zr or Zr-N layer interposed between Cu and Si were examined by the depth profiling techniques using the Auger electron spectoscopy analysis.It is found that the Cu, Cu-Zr/Zr/Si and Cu/Cu-Zr/Zr-N/Si systems are stable up to the temperatures of 450℃ and 550℃ due to the annealing,respectively,although the form ation of Cu-Zr-Si temary alloy is the direction of the reaction taking place in these systems.The present amomhous alloy is found to be effective as a barrier for preventing the Cu diffusion in the contact system.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Cu metallization technology / diffusion barrier / Cu-Zr amorphous alloy / metal-Semicondactor Contact / Cu-interconnect line
Paper # CPM94-63
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Conference Information
Committee CPM
Conference Date 1994/9/12(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Application of amorphous Cu-Zr alloy films Combined with Zr or Zr- N layers for the Contact system of Cu/Si
Sub Title (in English)
Keyword(1) Cu metallization technology
Keyword(2) diffusion barrier
Keyword(3) Cu-Zr amorphous alloy
Keyword(4) metal-Semicondactor Contact
Keyword(5) Cu-interconnect line
1st Author's Name Shinya Kagomi
1st Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Kitami Institute of Technology()
2nd Author's Name Mayumi Takeyama
2nd Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Kitami Institute of Technology
3rd Author's Name Atsushi Noya
3rd Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Kitami Institute of Technology
4th Author's Name Katsutaka Sasaki
4th Author's Affiliation Department of Material Science,Faculty of Engineering,Kitami Institute of Technology
5th Author's Name Kouichirou Sakanshi
5th Author's Affiliation Department of Electrical and Electronic Engineering,Faculty of Engineering,Kitami Institute of Technology
Date 1994/9/12
Paper # CPM94-63
Volume (vol) vol.94
Number (no) 226
Page pp.pp.-
#Pages 6
Date of Issue