Presentation 1993/10/18
New Photosensitive Adhesive Resin Interconnection Technology for Chip-on-Glass
Koji Matsui, Kazuaki Utsumi, Hiroshi Ohkubo, Chouei Sugitani,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The authors have developed a new COG(Chip-on-Glass)technology interconnection PARI(Photosensitive Adhesive Resin Interconnection) technology,in which an LSI chip is electrically and mechanically connected to glass substrate like a sticker in a moment using indium bumps fromed selectively on electrode pads of an LSI chip and adhesive portions formed by new photosensitive adhesive between both electrode pads. With this new PARI technology 50μm pitch electrode pads of drive r LSIs can be bonded to ITO electrode terminals on an LCD panel at low temperature(less than 150℃).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) LCD / COG / fine pitch interconnection / photosensitive adhesive resin / indium bump
Paper # CPM93-77
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Conference Information
Committee CPM
Conference Date 1993/10/18(1days)
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Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) New Photosensitive Adhesive Resin Interconnection Technology for Chip-on-Glass
Sub Title (in English)
Keyword(1) LCD
Keyword(2) COG
Keyword(3) fine pitch interconnection
Keyword(4) photosensitive adhesive resin
Keyword(5) indium bump
1st Author's Name Koji Matsui
1st Author's Affiliation Material Development Center,NEC Corporation()
2nd Author's Name Kazuaki Utsumi
2nd Author's Affiliation Material Development Center,NEC Corporation
3rd Author's Name Hiroshi Ohkubo
3rd Author's Affiliation Color LCD Division,NEC Corporation
4th Author's Name Chouei Sugitani
4th Author's Affiliation Color LCD Division,NEC Corporation
Date 1993/10/18
Paper # CPM93-77
Volume (vol) vol.93
Number (no) 275
Page pp.pp.-
#Pages 7
Date of Issue