Presentation 1993/9/17
MBE Growth of Bi System Super conducting Thin Films using Oxygen Radical Beam
Minoru Nishikawa, Iwao Nakamura, Shinichiro Konishi, Toyokazu Tambo, Hiromu Ueba, Chiei Tatsuyama,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Bi-Sr-Cu-Ca-O thin films have been prepaxed using Molecular Beam Epitaxy System(MBE)and their crystalline quality was characterized by Reflection High Energy Electron Diffraction,X-Ray Photoemission and X-Ray Diffraction Bi_2Sr_2Ca_1Cu_2O_x(2212)thin films have been prepared by sequential-shutter-control and Radical oxygen used for oxidation source.The(2212)phase was controlling sequential deposition,as conformed by XPS analysis.This XRD show peaks have at charactering as single(2212)phase.RHEED show sharp streak indicating that the films has a smooth surface at atomic scale.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Bi-Sr-Ca-Cu-O / MBE / RHEED / XPS / XRD
Paper # CPM93-74
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Conference Information
Committee CPM
Conference Date 1993/9/17(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) MBE Growth of Bi System Super conducting Thin Films using Oxygen Radical Beam
Sub Title (in English)
Keyword(1) Bi-Sr-Ca-Cu-O
Keyword(2) MBE
Keyword(3) RHEED
Keyword(4) XPS
Keyword(5) XRD
1st Author's Name Minoru Nishikawa
1st Author's Affiliation Major in Electronics,Faculty of Engineering,Toyama University()
2nd Author's Name Iwao Nakamura
2nd Author's Affiliation Kokusai Electric
3rd Author's Name Shinichiro Konishi
3rd Author's Affiliation Major in Electronics Faculty of Engineering Toyama University
4th Author's Name Toyokazu Tambo
4th Author's Affiliation Department of Electronics & Infomation,Faculty of Engineering, Toyama University
5th Author's Name Hiromu Ueba
5th Author's Affiliation Department of Electronics & Infomation,Faculty of Engineering, Toyama University
6th Author's Name Chiei Tatsuyama
6th Author's Affiliation Department of Electronics & Infomation,Faculty of Engineering, Toyama University
Date 1993/9/17
Paper # CPM93-74
Volume (vol) vol.93
Number (no) 223
Page pp.pp.-
#Pages 6
Date of Issue