Presentation 1993/9/17
Optical properties of TaOx thin film prepared by rf reactive sputtering
Tsutomu Yamazaki, Keiichi Miyairi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Optical properties of TaOx thin film prepared by rf sputtering have been measured.Optical properties such as refractive index and attenuation constant of these films evaluated by the method proposed by Minkov manifested the significant difference between nontreated and thermally aged samples.That is,thermally aging gives the large refractive index,The absorption constant which is difined as the optical loss per one centimeter of thse films has been also measured.The absorption constant of thier films less than 800 nm is affected significantly thermal aging.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) refractive index / attenuation constant / absorption constant / annealing / oxidation
Paper # CPM93-72
Date of Issue

Conference Information
Committee CPM
Conference Date 1993/9/17(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optical properties of TaOx thin film prepared by rf reactive sputtering
Sub Title (in English)
Keyword(1) refractive index
Keyword(2) attenuation constant
Keyword(3) absorption constant
Keyword(4) annealing
Keyword(5) oxidation
1st Author's Name Tsutomu Yamazaki
1st Author's Affiliation Department of electric and electronic engineering,Faculty of Engineering,Shinshu University()
2nd Author's Name Keiichi Miyairi
2nd Author's Affiliation Department of electric and electronic engineering,Faculty of Engineering,Shinshu University
Date 1993/9/17
Paper # CPM93-72
Volume (vol) vol.93
Number (no) 223
Page pp.pp.-
#Pages 5
Date of Issue