| Presentation | 1995/5/19 Characterization of ZnCdSe/ZnSe SQW Structures Kenji Sasamoto, Takamasa Kato, Takashi Matsumoto, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | ZnSe/ZnCdSe/ZnSe single quantum well(SQW) structures were grown on GaAs(100) substrates by MBE. Lattice constants and layer thicknesses of well and barrier layers were determined from measured and simulated X-ray diffraction spectra. PL spectra were measured and discussed on the basis of the SQW stracture determined by X-ray diffraction. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | quantum well / X-ray diffraction / PL / ZnCdSe / ZnSe |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 1995/5/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characterization of ZnCdSe/ZnSe SQW Structures |
| Sub Title (in English) | |
| Keyword(1) | quantum well |
| Keyword(2) | X-ray diffraction |
| Keyword(3) | PL |
| Keyword(4) | ZnCdSe |
| Keyword(5) | ZnSe |
| 1st Author's Name | Kenji Sasamoto |
| 1st Author's Affiliation | Department of Electronic Engineering. Yamanashi University() |
| 2nd Author's Name | Takamasa Kato |
| 2nd Author's Affiliation | Department of Electronic Engineering. Yamanashi University |
| 3rd Author's Name | Takashi Matsumoto |
| 3rd Author's Affiliation | Department of Electronic Engineering. Yamanashi University |
| Date | 1995/5/19 |
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| Volume (vol) | vol.95 |
| Number (no) | 40 |
| Page | pp.pp.- |
| #Pages | 6 |
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