Presentation 1996/10/25
Application of the Radiochemical Analytical Method to Material Science
Masaaki KATOH,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The radiochemical analytical method is both accurate and high sensitive, and is one of the most important techniques for characterizing electronic materials. This paper provides several examples of the application of this method in the field of material science. These include the determination of ultra-trace elements in silicon single crystals by charged particle activation analysis and neutron activation analysis, the determination of impurities in a SiO_2/Si interface and the cross check of the trace analytical method for ultra-trace elements on silicon surfaces by neutron activation analysis.
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Keyword(in English) charged particle activation analysis / neutron activation analysis / substoichiometry / silicon
Paper # CPM96-92
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Conference Information
Committee CPM
Conference Date 1996/10/25(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Application of the Radiochemical Analytical Method to Material Science
Sub Title (in English)
Keyword(1) charged particle activation analysis
Keyword(2) neutron activation analysis
Keyword(3) substoichiometry
Keyword(4) silicon
1st Author's Name Masaaki KATOH
1st Author's Affiliation Project Team-1, NTT Science and Core Technology Laboratory Group()
Date 1996/10/25
Paper # CPM96-92
Volume (vol) vol.96
Number (no) 329
Page pp.pp.-
#Pages 6
Date of Issue