Presentation 1997/3/14
A Report on the ISTFA'96
Mitsuo Iwaoka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The papers reported at the ISTFA'96 (The 22nd International Symposium for Testing and Failure Analysis) are described. These papers, including a various case studies, show the recent trend of failure analysis techniques and equipment for LSI. These are useful to analytical engineers.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) falure analysis / analysis technique / analytical equipment
Paper # R96-47,CPM96-156
Date of Issue

Conference Information
Committee CPM
Conference Date 1997/3/14(1days)
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Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Report on the ISTFA'96
Sub Title (in English)
Keyword(1) falure analysis
Keyword(2) analysis technique
Keyword(3) analytical equipment
1st Author's Name Mitsuo Iwaoka
1st Author's Affiliation High-Reliability Components Corporation()
Date 1997/3/14
Paper # R96-47,CPM96-156
Volume (vol) vol.96
Number (no) 575
Page pp.pp.-
#Pages 6
Date of Issue