Presentation 1998/3/13
Tolerance for Single-Event Effect of Bipolar Transistors for Space and Commercial system application
Takahiro Suzuki, Kenji Sugimoto, Sinichi shugyo, Satoshi Kuboyama, Sumio Matsuda, Toshio Hirao, Isamu Nashiyama, Takayuki Hirose, Hideharu Ohira,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In space, a failure mode of semiconductor devices as single event effect by a incident of a radiation from solar flare and a cosmic ray is known. In the previous study, single event effect of Power MOSFETs is studied. In this study, we observe single event effect of bipolar transistors using a measurement techniques for Power MOSFETs and obtain a data of a tolerance for single event effect of bipolar transistors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) bipolar transistors / single event effect
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Conference Information
Committee CPM
Conference Date 1998/3/13(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Tolerance for Single-Event Effect of Bipolar Transistors for Space and Commercial system application
Sub Title (in English)
Keyword(1) bipolar transistors
Keyword(2) single event effect
1st Author's Name Takahiro Suzuki
1st Author's Affiliation National Space Development Agency of Japan()
2nd Author's Name Kenji Sugimoto
2nd Author's Affiliation National Space Development Agency of Japan
3rd Author's Name Sinichi shugyo
3rd Author's Affiliation National Space Development Agency of Japan
4th Author's Name Satoshi Kuboyama
4th Author's Affiliation National Space Development Agency of Japan
5th Author's Name Sumio Matsuda
5th Author's Affiliation National Space Development Agency of Japan
6th Author's Name Toshio Hirao
6th Author's Affiliation Japan Atomic Energy Research Institute Takasaki Radiation Chemistry Research Establishment
7th Author's Name Isamu Nashiyama
7th Author's Affiliation Japan Atomic Energy Research Institute Takasaki Radiation Chemistry Research Establishment
8th Author's Name Takayuki Hirose
8th Author's Affiliation Ryoei Technica Corp.
9th Author's Name Hideharu Ohira
9th Author's Affiliation Ryoei Technica Corp.
Date 1998/3/13
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Volume (vol) vol.97
Number (no) 601
Page pp.pp.-
#Pages 5
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